| Analysis of the impact of process variations on clock skew S Zanella, A Nardi, A Neviani, M Quarantelli, S Saxena, C Guardiani IEEE Transactions on Semiconductor Manufacturing 13 (4), 401-407, 2000 | 73 | 2000 |
| Functional Safety Methodologies for Automotive Applications A Nardi, A Armato IEEE International Conference on Computer Aided Design (ICCAD), 956-961, 2017 | 68 | 2017 |
| Logic synthesis for manufacturability A Nardi, AL Sangiovanni-Vincentelli IEEE Design & Test of Computers 21 (3), 192-199, 2004 | 45 | 2004 |
| Impact of unrealistic worst case modeling on the performance of VLSI circuits in deep submicron CMOS technologies A Nardi, A Neviani, E Zanoni, M Quarantelli, C Guardiani IEEE Transactions on Semiconductor Manufacturing 12 (4), 396-402, 1999 | 39 | 1999 |
| Synthesis for manufacturability: A sanity check A Nardi, AL Sangiovanni-Vincentelli Design, Automation and Test in Europe Conference and Exhibition, 2004 …, 2004 | 32 | 2004 |
| Degradation mechanisms in polysilicon emitter bipolar junction transistors for digital applications L Vendrame, P Pavan, G Corva, A Nardi, A Neviani, E Zanoni Microelectronics Reliability 40 (2), 207-230, 2000 | 32 | 2000 |
| Statistical on-chip variation timing analysis A Adams, A Nardi US Patent 8,307,317, 2012 | 23 | 2012 |
| Aggregate sensitivity for statistical static timing analysis E Tuncer, A Nardi, SR Naidu, A Antonau US Patent 7,458,049, 2008 | 22 | 2008 |
| Lithography aware leakage analysis E Tuncer, H Zheng, V Raghavan, A Devgan, A Ajami, A Nardi, T Lin, ... US Patent 8,572,523, 2013 | 21 | 2013 |
| A methodology for the computation of an upper bound on nose current spectrum of CMOS switching activity A Nardi, H Zeng, JL Garrett, L Daniel, AL Sangiovanni-Vincentelli Proceedings of the 2003 IEEE/ACM international conference on Computer-aided …, 2003 | 18 | 2003 |
| Timing analysis using statistical on-chip variation A Adams, A Nardi US Patent 7,992,114, 2011 | 16 | 2011 |
| Use of statistical timing analysis on real designs A Nardi, E Tuncer, S Naidu, A Antonau, S Gradinaru, T Lin, J Song Proceedings of the conference on Design, automation and test in Europe, 1605 …, 2007 | 13 | 2007 |
| Analysis of the impact of intra-die variance on clock skew S Zanella, A Nardi, M Quarantelli, A Neviani, C Guardiani Statistical Metrology, 1999. IWSM. 1999 4th International Workshop on, 14-17, 1999 | 13 | 1999 |
| Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors A Neviani, P Pavan, A Nardi, A Chantre, L Vendrame, E Zanoni IEEE Transactions on Electron Devices 44 (11), 2059-2063, 1997 | 9 | 1997 |
| Lithography aware timing analysis E Tuncer, H Zheng, V Raghavan, A Devgan, A Ajami, A Nardi, T Lin, ... US Patent 8,473,876, 2013 | 8 | 2013 |
| Realistic worst-case modeling by performance level principal component analysis A Nardi, A Neviani, C Guardiani Quality Electronic Design, 2000. ISQED 2000. Proceedings. IEEE 2000 First …, 2000 | 2 | 2000 |
| Comparison of Synchronous and Asynchronous Designs For a Maximum A-Posterior Probability Decoder Memory Block I Mavroidis, A Nardi, E Yeo EE241 Midterm Report, University of California, Berkeley, CA, Spring, 2000 | 1 | 2000 |
| Lithography aware leakage analysis E Tuncer, H Zheng, V Raghavan, A Devgan, A Ajami, A Nardi, T Lin, ... US Patent 9,576,098, 2017 | | 2017 |
| A Comparison of Synchronous and Asynchronous design I Mavroidis, A Nardi, E Yeo | | |
