Shangcong Cheng
Shangcong Cheng
Guest Scientist, Molecular Foundry of Lawrence Berkeley National Lab
Verified email at
Cited by
Cited by
EELS log‐ratio technique for specimen‐thickness measurement in the TEM
T Malis, SC Cheng, RF Egerton
Journal of electron microscopy technique 8 (2), 193-200, 1988
Stabilization of cubic AlN in epitaxial AlN/TiN superlattices
A Madan, IW Kim, SC Cheng, P Yashar, VP Dravid, SA Barnett
Physical Review Letters 78 (9), 1743, 1997
Synthesis of superhard carbon nitride composite coatings
D Li, X Chu, SC Cheng, XW Lin, VP Dravid, YW Chung, MS Wong, ...
Applied Physics Letters 67 (2), 203-205, 1995
Measurement of local thickness by electron energy-loss spectroscopy
RF Egerton, SC Cheng
Ultramicroscopy 21 (3), 231-244, 1987
Structure and hardness studies of CNx/TiN nanocomposite coatings
D Li, XW Lin, SC Cheng, VP Dravid, YW Chung, MS Wong, WD Sproul
Applied Physics Letters 68 (9), 1211-1213, 1996
Epitaxial growth of anisotropically shaped, single-crystal particles of cubic SrTiO3
K Watari, B Brahmaroutu, GL Messing, S Trolier-McKinstry, SC Cheng
Journal of Materials Research 15, 846-849, 2000
Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer
RF Egerton, YY Yang, SC Cheng
Ultramicroscopy 48 (3), 239-250, 1993
Characterization of an analytical electron microscope with a NiO test specimen
RF Egerton, SC Cheng
Ultramicroscopy 55 (1), 43-54, 1994
Characteristics of amorphous and polycrystalline silicon films deposited at 120° C by electron cyclotron resonance plasma-enhanced chemical vapor deposition
S Bae, AK Kalkan, S Cheng, SJ Fonash
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3 …, 1998
Single-crystal silicon films on glass
KP Gadkaree, K Soni, SC Cheng, C Kosik-Williams
Journal of Materials Research 22, 2363-2367, 2007
Momentum-transfer resolved electron energy loss spectroscopy of solids: problems, solutions and applications
YY Wang, SC Cheng, VP Dravid, FC Zhang
Ultramicroscopy 59 (1-4), 109-119, 1995
The core-shell structure in ultrafine X7R dielectric ceramics
X Liu, S Cheng, CA Randall
Journal of the Korean Physical Society 32 (SUPPL. 1), S312-S315, 1998
Use of EELS to study the absorption edge of fused silica
SC Cheng, SL Schiefelbein, LA Moore, M Pierson-Stull, CM Smith, S Sen
Journal of non-crystalline solids 352 (28-29), 3140-3146, 2006
Band-tail photoluminescence in nanocrystalline Si
AK Kalkan, SJ Fonash, SC Cheng
Applied Physics Letters 77 (1), 55-57, 2000
A nano-flake model for the medium range structure in vitreous silica
S Cheng
Physics and Chemistry of Glasses-European Journal of Glass Science and …, 2017
Coordination and optical attenuation of TiO2–SiO2 glass by electron energy loss spectroscopy
SC Cheng
Journal of non-crystalline solids 354 (31), 3735-3741, 2008
Determination of the valence of Pr in () superconducting compounds by electron-energy-loss spectroscopy
SC Cheng, VP Dravid, TJ Goodwin, RN Shelton, HB Radousky
Physical Review B 53 (17), 11779, 1996
Elemental analysis of thick amorphous specimens by EELS
SC Cheng, RF Egerton
Micron 24 (3), 251-256, 1993
New interpretation of X-ray diffraction pattern of vitreous silica
S Cheng
Ceramics 4 (1), 83-96, 2021
J. Vac. Sci. Technol. A
C Bae, AK Kalkan, S Cheng, SJ Fonash
J. Vac. Sci. Technol. A 22, 2379, 2004
The system can't perform the operation now. Try again later.
Articles 1–20