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Shangcong Cheng
Shangcong Cheng
Guest Scientist, Molecular Foundry of Lawrence Berkeley National Lab
Verified email at lbl.gov
Title
Cited by
Cited by
Year
EELS log‐ratio technique for specimen‐thickness measurement in the TEM
T Malis, SC Cheng, RF Egerton
Journal of electron microscopy technique 8 (2), 193-200, 1988
9931988
Stabilization of cubic AlN in epitaxial AlN/TiN superlattices
A Madan, IW Kim, SC Cheng, P Yashar, VP Dravid, SA Barnett
Physical Review Letters 78 (9), 1743, 1997
3341997
Synthesis of superhard carbon nitride composite coatings
D Li, X Chu, SC Cheng, XW Lin, VP Dravid, YW Chung, MS Wong, ...
Applied Physics Letters 67 (2), 203-205, 1995
2071995
Measurement of local thickness by electron energy-loss spectroscopy
RF Egerton, SC Cheng
Ultramicroscopy 21 (3), 231-244, 1987
1801987
Structure and hardness studies of CNx/TiN nanocomposite coatings
D Li, XW Lin, SC Cheng, VP Dravid, YW Chung, MS Wong, WD Sproul
Applied Physics Letters 68 (9), 1211-1213, 1996
1621996
Epitaxial growth of anisotropically shaped, single-crystal particles of cubic SrTiO3
K Watari, B Brahmaroutu, GL Messing, S Trolier-McKinstry, SC Cheng
Journal of Materials Research 15, 846-849, 2000
772000
Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer
RF Egerton, YY Yang, SC Cheng
Ultramicroscopy 48 (3), 239-250, 1993
531993
Characterization of an analytical electron microscope with a NiO test specimen
RF Egerton, SC Cheng
Ultramicroscopy 55 (1), 43-54, 1994
461994
Characteristics of amorphous and polycrystalline silicon films deposited at 120° C by electron cyclotron resonance plasma-enhanced chemical vapor deposition
S Bae, AK Kalkan, S Cheng, SJ Fonash
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3 …, 1998
361998
Single-crystal silicon films on glass
KP Gadkaree, K Soni, SC Cheng, C Kosik-Williams
Journal of Materials Research 22, 2363-2367, 2007
312007
Momentum-transfer resolved electron energy loss spectroscopy of solids: problems, solutions and applications
YY Wang, SC Cheng, VP Dravid, FC Zhang
Ultramicroscopy 59 (1-4), 109-119, 1995
251995
The core-shell structure in ultrafine X7R dielectric ceramics
X Liu, S Cheng, CA Randall
Journal of the Korean Physical Society 32 (SUPPL. 1), S312-S315, 1998
211998
Use of EELS to study the absorption edge of fused silica
SC Cheng, SL Schiefelbein, LA Moore, M Pierson-Stull, CM Smith, S Sen
Journal of non-crystalline solids 352 (28-29), 3140-3146, 2006
192006
Band-tail photoluminescence in nanocrystalline Si
AK Kalkan, SJ Fonash, SC Cheng
Applied Physics Letters 77 (1), 55-57, 2000
162000
A nano-flake model for the medium range structure in vitreous silica
S Cheng
Physics and Chemistry of Glasses-European Journal of Glass Science and …, 2017
152017
Coordination and optical attenuation of TiO2–SiO2 glass by electron energy loss spectroscopy
SC Cheng
Journal of non-crystalline solids 354 (31), 3735-3741, 2008
152008
Determination of the valence of Pr in () superconducting compounds by electron-energy-loss spectroscopy
SC Cheng, VP Dravid, TJ Goodwin, RN Shelton, HB Radousky
Physical Review B 53 (17), 11779, 1996
131996
Elemental analysis of thick amorphous specimens by EELS
SC Cheng, RF Egerton
Micron 24 (3), 251-256, 1993
131993
New interpretation of X-ray diffraction pattern of vitreous silica
S Cheng
Ceramics 4 (1), 83-96, 2021
122021
J. Vac. Sci. Technol. A
C Bae, AK Kalkan, S Cheng, SJ Fonash
J. Vac. Sci. Technol. A 22, 2379, 2004
112004
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