Ioannis Voyiatzis
Ioannis Voyiatzis
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A concurrent built-in self-test architecture based on a self-testing RAM
I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis
IEEE Transactions on Reliability 54 (1), 69-78, 2005
632005
An efficient built-in self test method for robust path delay fault testing
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Journal of Electronic Testing 8 (2), 219-222, 1996
441996
A low-cost concurrent BIST scheme for increased dependability
I Voyiatzis, C Halatsis
IEEE Transactions on Dependable and Secure Computing 2 (2), 150-156, 2005
432005
Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time
I Voyiatzis, D Gizopoulos, A Paschalis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (9 …, 2005
352005
An input vector monitoring concurrent BIST architecture based on a precomputed test set
I Voyiatzis, A Paschalis, D Gizopoulos, C Halatsis, FS Makri, ...
IEEE Transactions on Computers 57 (8), 1012-1022, 2008
312008
Test vector embedding into accumulator-generated sequences: A linear-time solution
I Voyiatzis
IEEE Transactions on Computers 54 (4), 476-484, 2005
302005
R-CBIST: An effective RAM-based input vector monitoring concurrent BIST technique
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
261998
An accumulator-based compaction scheme for online BIST of RAMs
I Voyiatzis
IEEE transactions on very large scale integration (VLSI) systems 16 (9 …, 2008
252008
Accumulator-based BIST approach for stuck-open and delay fault testing
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Proceedings of the 1995 European conference on Design and Test, 431, 1995
251995
A concurrent BIST architecture based on monitoring square windows
I Voyiatzis, T Haniotakis, C Efstathiou, H Antonopoulou
5th International Conference on Design & Technology of Integrated Systems in …, 2010
242010
An ALU-based BIST scheme for word-organized RAMs
I Voyiatzis
IEEE Transactions on Computers 57 (5), 577-590, 2008
212008
Accumulator-based weighted pattern generation
I Voyiatzis, D Gizopoulos, A Paschalis
11th IEEE International On-Line Testing Symposium, 215-220, 2005
202005
Accumulator based 3-weight pattern generation
A Paschalis, I Voyiatzis, D Gizopoulos
IEEE transactions on very large scale integration (VLSI) systems 20 (2), 357-361, 2011
192011
Recursive pseudo-exhaustive two-pattern generation
I Voyiatzis, D Gizopoulos, A Paschalis
IEEE transactions on very large scale integration (VLSI) systems 18 (1), 142-152, 2009
192009
Input vector monitoring concurrent BIST architecture using SRAM cells
I Voyiatzis, C Efstathiou
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (7 …, 2013
182013
Algorithm for the generation of SIC pairs and its implementation in a BIST environment
I Voyiatzis, T Haniotakis, C Halatsis
IEE Proceedings-Circuits, Devices and Systems 153 (5), 427-432, 2006
182006
Accumulator-based compression in symmetric transparent RAM BIST
I Voyiatzis
International Conference on Design and Test of Integrated Systems in …, 2006
132006
An accumulator-based BIST approach for two-pattern testing
I Voyiatzis, A Paschalis, D Nikolos, C Halatsis
Journal of Electronic Testing 15 (3), 267-278, 1999
131999
Design and Implementation of an E-exam System Based on the Android Platform
G Meletiou, I Voyiatzis, V Stavroulaki, C Sgouropoulou
2012 16th Panhellenic Conference on Informatics, 375-380, 2012
122012
On the modulo 2n+1 multiplication for diminished-1 operands
C Efstathiou, I Voyiatzis, N Sklavos
2008 2nd International Conference on Signals, Circuits and Systems, 1-5, 2008
122008
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