Carmine Ciofi
Carmine Ciofi
Professor of Electronics, University of Messina
No verified email
Title
Cited by
Cited by
Year
Low-frequency noise measurements as a characterization tool for degradation phenomena in solid-state devices
C Ciofi, B Neri
Journal of Physics D: Applied Physics 33 (21), R199, 2000
1002000
Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics
G Giusi, F Crupi, C Pace, C Ciofi, G Groeseneken
IEEE Transactions on Electron Devices 53 (4), 823-828, 2006
652006
Noise and fluctuations in submicrometric Al-Si interconnect lines
B Neri, C Ciofi, V Dattilo
IEEE Transactions On Electron Devices 44 (9), 1454-1459, 1997
521997
Observation of hot-carrier-induced nFET gate-oxide breakdown in dynamically stressed CMOS circuits
B Kaczer, F Crupi, R Degraeve, P Roussel, C Ciofi, G Groeseneken
Digest. International Electron Devices Meeting,, 171-174, 2002
472002
Ultraflexible tactile piezoelectric sensor based on low-temperature polycrystalline silicon thin-film transistor technology
F Maita, L Maiolo, A Minotti, A Pecora, D Ricci, G Metta, G Scandurra, ...
IEEE Sensors Journal 15 (7), 3819-3826, 2015
422015
An ultralow noise preamplifier for low frequency noise measurements
G Cannatā, G Scandurra, C Ciofi
Review of Scientific Instruments 80 (11), 114702, 2009
382009
How to enlarge the bandwidth without increasing the noise in OP-AMP-based transimpedance amplifier
C Ciofi, F Crupi, C Pace, G Scandurra
IEEE transactions on instrumentation and measurement 55 (3), 814-819, 2006
382006
Electrical characterization and hydrogen peroxide sensing properties of gold/nafion: polypyrrole/MWCNTs electrochemical devices
G Scandurra, A Arena, C Ciofi, G Saitta
Sensors 13 (3), 3878-3888, 2013
372013
N, N-Dialkylcarbamato complexes as precursors for the chemical implantation of metal cations on a silica support
L Abis, DB Dell'amico, C Busetto, F Calderazzo, R Caminiti, C Ciofi, ...
Journal of Materials Chemistry 8 (3), 751-759, 1998
371998
Dedicated instrumentation for high sensitivity, low frequency noise measurement systems
C Ciofi, G Giusi, G Scandurra, B Neri
Fluctuation and Noise Letters 4 (02), L385-L402, 2004
362004
Ultra low-noise current sources
C Ciofi, R Giannetti, V Dattilo, B Neri
IEEE Transactions on Instrumentation and Measurement 47 (1), 78-81, 1998
361998
Magnetic field stabilization for magnetically shielded volumes by external field coils
T Bryś, S Czekaj, M Daum, P Fierlinger, D George, R Henneck, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
352005
Low-frequency (1/f) noise behavior of locally stressed HfO/sub 2//TiN gate-stack pMOSFETs
G Giusi, E Simoen, G Eneman, P Verheyen, F Crupi, K De Meyer, ...
IEEE electron device letters 27 (6), 508-510, 2006
342006
GALS networks on chip: a new solution for asynchronous delay-insensitive links
G Campobello, M Castano, C Ciofi, D Mangano
Proceedings of the Design Automation & Test in Europe Conference 2, 1-6, 2006
332006
A new circuit topology for the realization of very low-noise wide-bandwidth transimpedance amplifier
C Ciofi, F Crupi, C Pace, G Scandurra, M Patanč
IEEE Transactions on Instrumentation and Measurement 56 (5), 1626-1631, 2007
302007
A new method for high sensitivity noise measurements
C Ciofi, F Crupi, C Pace
IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001
302001
Pulsed laser deposition and characterization of conductive RuO2 thin films
A Iembo, F Fuso, E Arimondo, C Ciofi, G Pennelli, GM Curro, F Neri, ...
Journal of materials research 12 (6), 1433-1436, 1997
291997
Electrochemical detection of p-aminophenol by flexible devices based on multi-wall carbon nanotubes dispersed in electrochemically modified nafion
G Scandurra, A Antonella, C Ciofi, G Saitta, M Lanza
Sensors 14 (5), 8926-8939, 2014
272014
On the role of interface states in low-voltage leakage currents of metal–oxide–semiconductor structures
F Crupi, C Ciofi, A Germanō, G Iannaccone, JH Stathis, S Lombardo
Applied physics letters 80 (24), 4597-4599, 2002
262002
Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits
C Ciofi, M De Marinis, B Neri
IEEE transactions on instrumentation and measurement 46 (4), 789-793, 1997
261997
The system can't perform the operation now. Try again later.
Articles 1–20