Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution YS Chu, JM Yi, F De Carlo, Q Shen, WK Lee, HJ Wu, CL Wang, JY Wang, ...
Applied Physics Letters 92 (10), 2008
260 2008 Nondestructive nanoscale 3D elemental mapping and analysis of a solid oxide fuel cell anode KN Grew, YS Chu, J Yi, AA Peracchio, JR Izzo, Y Hwu, F De Carlo, ...
Journal of the Electrochemical Society 157 (6), B783, 2010
173 2010 Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement YT Chen, TN Lo, YS Chu, J Yi, CJ Liu, JY Wang, CL Wang, CW Chiu, ...
Nanotechnology 19 (39), 395302, 2008
126 2008 Morphological and topological analysis of coarsened nanoporous gold by x-ray nanotomography YK Chen, YS Chu, JM Yi, I McNulty, Q Shen, PW Voorhees, DC Dunand
Applied Physics Letters 96 (4), 2010
124 2010 Three-dimensional mapping of nickel oxidation states using full field x-ray absorption near edge structure nanotomography GJ Nelson, WM Harris, JR Izzo, KN Grew, WKS Chiu, YS Chu, J Yi, ...
Applied Physics Letters 98 (17), 2011
80 2011 Hard x-ray Zernike microscopy reaches 30 nm resolution YT Chen, TY Chen, J Yi, YS Chu, WK Lee, CL Wang, IM Kempson, Y Hwu, ...
Optics letters 36 (7), 1269-1271, 2011
61 2011 Coherent microradiology directly observes a critical cathode-anode distance effect in localized electrochemical deposition SK Seol, JM Yi, X Jin, CC Kim, JH Je, WL Tsai, PC Hsu, Y Hwu, CH Chen, ...
electrochemical and solid-state letters 7 (9), C95, 2004
39 2004 Interaction of micropipes with foreign polytype inclusions in SiC MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, MU Kim, JH Je, ...
Journal of applied physics 100 (9), 2006
31 2006 dependence of synchrotron x-ray induced electroless nickel depositionPH Borse, JM Yi, JH Je, WL Tsai, Y Hwu
Journal of Applied Physics 95 (3), 1166-1170, 2004
28 2004 Formation of magnetic Ni nanoparticles in x-ray irradiated electroless solution PH Borse, JM Yi, JH Je, SD Choi, Y Hwu, P Ruterana, G Nouet
Nanotechnology 15 (6), S389, 2004
21 2004 High-resolution hard-x-ray microscopy using second-order zone-plate diffraction J Yi, YS Chu, YT Chen, TY Chen, Y Hwu, G Margaritondo
Journal of Physics D: Applied Physics 44 (23), 232001, 2011
20 2011 X-ray imaging apparatus and control method for the same J Yi, D Kang, YH Sung
US Patent 9,504,439, 2016
19 2016 Role of micropipes in the formation of pores at foreign polytype boundaries in SiC crystals MY Gutkin, AG Sheinerman, TS Argunova, JM Yi, JH Je, SS Nagalyuk, ...
Physical Review B 76 (6), 064117, 2007
17 2007 Dynamical growth behavior of copper clusters during electrodeposition PC Hsu, Y Chu, JM Yi, CL Wang, SR Wu, Y Hwu, G Margaritondo
Applied Physics Letters 97 (3), 2010
16 2010 Magnetic resonance imaging system and magnetic resonance imaging method using excited sub-volumes in groups YB Kim, Y Ryu, J Son, J Yi, S Lee
US Patent 9,964,618, 2018
15 2018 X-ray imaging apparatus and method of controlling the same D Kang, K Sunghoon, YH Sung, J Yi, J hak Lee, HAN Seokmin
US Patent 10,085,706, 2018
14 2018 X-ray imaging apparatus, image processing apparatus and image processing method JM Yi, D Kang, YH Sung, J hak Lee, JY Choi, SM Han
US Patent 9,907,528, 2018
13 2018 X-ray imaging apparatus and method of controlling the same JM Yi, DG Kang, YH Sung, J hak Lee, SM Han
US Patent 9,743,901, 2017
13 2017 Colloid coalescence with focused x rays BM Weon, JT Kim, JH Je, JM Yi, S Wang, WK Lee
Physical Review Letters 107 (1), 018301, 2011
13 2011 Bright-field imaging of lattice distortions using x rays JM Yi, JH Je, YS Chu, Y Zhong, Y Hwu, G Margaritondo
Applied physics letters 89 (7), 2006
13 2006