| Corner occluder computational periscopy: Estimating a hidden scene from a single photograph SW Seidel, Y Ma, J Murray-Bruce, C Saunders, WT Freeman, ... 2019 IEEE International Conference on Computational Photography (ICCP), 1-9, 2019 | 56 | 2019 |
| Two-dimensional non-line-of-sight scene estimation from a single edge occluder SW Seidel, J Murray-Bruce, Y Ma, C Yu, WT Freeman, VK Goyal IEEE Transactions on Computational Imaging 7, 58-72, 2020 | 45 | 2020 |
| Identification and molecular analysis of glycosaminoglycans in cutaneous lupus erythematosus and dermatomyositis LM Chang, P Maheshwari, S Werth, L Schaffer, SR Head, C Kovarik, ... Journal of Histochemistry & Cytochemistry 59 (3), 336-345, 2011 | 28 | 2011 |
| Double your corners, double your fun: the doorway camera W Krska, SW Seidel, C Saunders, R Czajkowski, C Yu, J Murray-Bruce, ... 2022 IEEE International Conference on Computational Photography (ICCP), 1-12, 2022 | 13 | 2022 |
| Non-line-of-sight snapshots and background mapping with an active corner camera S Seidel, H Rueda-Chacón, I Cusini, F Villa, F Zappa, C Yu, VK Goyal Nature Communications 14 (1), 3677, 2023 | 8 | 2023 |
| Online beam current estimation in particle beam microscopy SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal IEEE Transactions on Computational Imaging 8, 521-535, 2022 | 5 | 2022 |
| Robustness of time-resolved measurement to unknown and variable beam current in particle beam microscopy L Watkins, SW Seidel, M Peng, A Agarwal, CY Christopher, VK Goyal 2021 IEEE International Conference on Image Processing (ICIP), 3487-3491, 2021 | 4 | 2021 |
| Prevention beats removal: Avoiding stripe artifacts from current variation in particle beam microscopy through time-resolved sensing L Watkins, S Seidel, M Peng, A Agarwal, C Yu, V Goyal Microscopy and Microanalysis 27 (S1), 422-425, 2021 | 4 | 2021 |
| Denoising particle beam micrographs with plug-and-play methods M Peng, R Kitichotkul, SW Seidel, C Yu, VK Goyal IEEE Transactions on Computational Imaging 9, 581-593, 2023 | 3 | 2023 |
| Edge-resolved transient imaging: Performance analyses, optimizations, and simulations C Saunders, W Krska, J Tachella, SW Seidel, J Rapp, J Murray-Bruce, ... 2021 IEEE International Conference on Image Processing (ICIP), 2858-2862, 2021 | 3 | 2021 |
| Addressing neon gas field ion source instability through online beam current estimation SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal Microscopy and Microanalysis 28 (S1), 36-39, 2022 | 2 | 2022 |
| Edge-resolved non-line-of-sight imaging SW Seidel Boston University, 2023 | 1 | 2023 |
| Snapshot Non-Light-of-Sight Imaging with an Active Corner Camera S Seidel, H Rueda-Chacón, I Cusini, F Villa, F Zappa, C Yu, VK Goyal Computational Optical Sensing and Imaging, CTh3A. 1, 2023 | | 2023 |
| Non-Line-of-Sight Tracking and Mapping with an Active Corner Camera S Seidel, H Rueda-Chacon, I Cusini, F Villa, F Zappa, C Yu, VK Goyal arXiv preprint arXiv:2208.01702, 2022 | | 2022 |
| Online beam current estimation in particle beam microscopy through time-resolved measurement SW Seidel, L Watkins, M Peng, A Agarwal, CC Yu, VK Goyal Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2022 | | 2022 |
Vivek K GoyalBoston UniversityVerified email at bu.edu
