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Sheila (Werth) Seidel
Sheila (Werth) Seidel
Verified email at analog.com
Title
Cited by
Cited by
Year
Corner occluder computational periscopy: Estimating a hidden scene from a single photograph
SW Seidel, Y Ma, J Murray-Bruce, C Saunders, WT Freeman, ...
2019 IEEE International Conference on Computational Photography (ICCP), 1-9, 2019
562019
Two-dimensional non-line-of-sight scene estimation from a single edge occluder
SW Seidel, J Murray-Bruce, Y Ma, C Yu, WT Freeman, VK Goyal
IEEE Transactions on Computational Imaging 7, 58-72, 2020
452020
Identification and molecular analysis of glycosaminoglycans in cutaneous lupus erythematosus and dermatomyositis
LM Chang, P Maheshwari, S Werth, L Schaffer, SR Head, C Kovarik, ...
Journal of Histochemistry & Cytochemistry 59 (3), 336-345, 2011
282011
Double your corners, double your fun: the doorway camera
W Krska, SW Seidel, C Saunders, R Czajkowski, C Yu, J Murray-Bruce, ...
2022 IEEE International Conference on Computational Photography (ICCP), 1-12, 2022
132022
Non-line-of-sight snapshots and background mapping with an active corner camera
S Seidel, H Rueda-Chacón, I Cusini, F Villa, F Zappa, C Yu, VK Goyal
Nature Communications 14 (1), 3677, 2023
82023
Online beam current estimation in particle beam microscopy
SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal
IEEE Transactions on Computational Imaging 8, 521-535, 2022
52022
Robustness of time-resolved measurement to unknown and variable beam current in particle beam microscopy
L Watkins, SW Seidel, M Peng, A Agarwal, CY Christopher, VK Goyal
2021 IEEE International Conference on Image Processing (ICIP), 3487-3491, 2021
42021
Prevention beats removal: Avoiding stripe artifacts from current variation in particle beam microscopy through time-resolved sensing
L Watkins, S Seidel, M Peng, A Agarwal, C Yu, V Goyal
Microscopy and Microanalysis 27 (S1), 422-425, 2021
42021
Denoising particle beam micrographs with plug-and-play methods
M Peng, R Kitichotkul, SW Seidel, C Yu, VK Goyal
IEEE Transactions on Computational Imaging 9, 581-593, 2023
32023
Edge-resolved transient imaging: Performance analyses, optimizations, and simulations
C Saunders, W Krska, J Tachella, SW Seidel, J Rapp, J Murray-Bruce, ...
2021 IEEE International Conference on Image Processing (ICIP), 2858-2862, 2021
32021
Addressing neon gas field ion source instability through online beam current estimation
SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal
Microscopy and Microanalysis 28 (S1), 36-39, 2022
22022
Edge-resolved non-line-of-sight imaging
SW Seidel
Boston University, 2023
12023
Snapshot Non-Light-of-Sight Imaging with an Active Corner Camera
S Seidel, H Rueda-Chacón, I Cusini, F Villa, F Zappa, C Yu, VK Goyal
Computational Optical Sensing and Imaging, CTh3A. 1, 2023
2023
Non-Line-of-Sight Tracking and Mapping with an Active Corner Camera
S Seidel, H Rueda-Chacon, I Cusini, F Villa, F Zappa, C Yu, VK Goyal
arXiv preprint arXiv:2208.01702, 2022
2022
Online beam current estimation in particle beam microscopy through time-resolved measurement
SW Seidel, L Watkins, M Peng, A Agarwal, CC Yu, VK Goyal
Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2022
2022
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