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Olivier Bonnaud
Olivier Bonnaud
Professeur Emérite de Microélectronique Université de Rennes et Central-Supelec & DG du GIP-CNFM
Email confirmado em univ-rennes.fr
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Lateral polysilicon pn diodes: current-voltage characteristics simulation between 200 K and 400 K using a numerical approach
A Aziz, O Bonnaud, H Lhermite, F Raoult
IEEE transactions on Electron Devices 41 (2), 204-211, 1994
961994
Laser crystallization of silicon for high-performance thin-film transistors
R Dassow, JR Köhler, Y Helen, K Mourgues, O Bonnaud, ...
Semiconductor science and technology 15 (10), L31, 2000
882000
High mobility thin film transistors by Nd: YVO4-laser crystallization
Y Helen, R Dassow, M Nerding, K Mourgues, F Raoult, JR Köhler, ...
Thin Solid Films 383 (1-2), 143-146, 2001
602001
Microwave planar antenna with RF‐sputtered indium tin oxide films
N Outaleb, J Pinel, M Drissi, O Bonnaud
Microwave and Optical Technology Letters 24 (1), 3-7, 2000
492000
Nd: YVO4 laser crystallization for thin film transistors with a high mobility
R Dassow, JR Köhler, M Nerding, HP Strunk, Y Helen, K Mourgues, ...
MRS Online Proceedings Library (OPL) 621, Q9. 3.1, 2000
492000
Analysis of SiO2 thin films deposited by PECVD using an oxygen-TEOS-argon mixture
CE Viana, ANR da Silva, NI Morimoto, O Bonnaud
Brazilian Journal of Physics 31, 299-303, 2001
442001
Analysis of the activation energy of the subthreshold current in laser-and solid-phase-crystallized polycrystalline silicon thin-film transistors
L Pichon, A Mercha, R Carin, O Bonnaud, T Mohammed-Brahim, Y Helen, ...
Applied Physics Letters 77 (4), 576-578, 2000
442000
GIP-CNFM: a French education network moving from microelectronics to nanotechnologies CNFM: National coordination for education in microelectronics and nanotechnologies
O Bonnaud, P Gentil, A Bsiesy, S Retailleau, E Dufour-Gergam, JM Dorkel
2011 IEEE Global Engineering Education Conference (EDUCON), 122-127, 2011
402011
Performance of thin film transistors on unhydrogenated in-situ doped polysilicon films obtained by solid phase crystallization
K Mourgues, F Raoult, L Pichon, T Mohammed-Brahim, D Briand, ...
MRS Online Proceedings Library (OPL) 471, 155, 1997
391997
Realization of polycrystalline silicon magnetic sensors
F Le Bihan, E Carvou, B Fortin, R Rogel, AC Salaün, O Bonnaud
Sensors and Actuators A: Physical 88 (2), 133-138, 2001
362001
New approach for sensors and connecting objects involving microelectronic multidisciplinarity for a wide spectrum of applications
O Bonnaud
International Journal of Plasma Environmental Science & Technology 10 (2 …, 2016
352016
Single shot excimer laser crystallization and LPCVD silicon TFTs
Y Helen, K Mourgues, F Raoult, T Mohammed-Brahim, O Bonnaud, ...
Thin Solid Films 337 (1-2), 133-136, 1999
321999
Air-gap polycrystalline silicon thin-film transistors for fully integrated sensors
H Mahfoz-Kotb, AC Salaun, T Mohammed-Brahim, O Bonnaud
IEEE Electron Device Letters 24 (3), 165-167, 2003
312003
Annealing effects in the PECVD SiO2 thin films deposited using TEOS, Ar and O2 mixture
CE Viana, NI Morimoto, O Bonnaud
Microelectronics Reliability 40 (4-5), 613-616, 2000
292000
Study of mechanical stability of suspended bridge devices used as pH sensors
F Bendriaa, F Le Bihan, AC Salaün, T Mohammed-Brahim, O Bonnaud
Journal of non-crystalline solids 352 (9-20), 1246-1249, 2006
282006
Low temperature (≦ 600° C) unhydrogenated in-situ doped polysilicon thin film transistors: Towards a technology for flat panel displays
L Pichon, F Raoult, K Mourgues, K Kis-Sion, T Mohammed-Brahim, ...
Thin Solid Films 296 (1-2), 133-136, 1997
281997
P-type and N-type multi-gate polycrystalline silicon vertical thin film transistors based on low-temperature technology
P Zhang, E Jacques, R Rogel, O Bonnaud
Solid-state electronics 86, 1-5, 2013
272013
The French microelectronics training network supported by industry and education ministries
O Bonnaud, G Rey
Proceedings of International Conference on Microelectronic Systems Education …, 1997
271997
Thin film transistors fabricated by in situ doped unhydrogenated polysilicon films obtained by solid phase crystallization
L Pichon, K Mourgues, F Raoult, T Mohammed-Brahim, K Kis-Sion, ...
Semiconductor science and technology 16 (11), 918, 2001
262001
From amorphous to polycrystalline thin films: dependence on annealing time of structural and electronic properties
T Mohammed-Brahim, K Kis-Sion, D Briand, M Sarret, O Bonnaud, ...
Journal of non-crystalline solids 227, 962-966, 1998
261998
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Artigos 1–20