| A concurrent built-in self-test architecture based on a self-testing RAM I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis IEEE Transactions on Reliability 54 (1), 69-78, 2005 | 79 | 2005 |
| A deep learning classification framework for early prediction of team-based academic performance F Giannakas, C Troussas, I Voyiatzis, C Sgouropoulou Applied Soft Computing 106, 107355, 2021 | 77 | 2021 |
| Collaborative activities recommendation based on students’ collaborative learning styles using ANN and WSM C Troussas, F Giannakas, C Sgouropoulou, I Voyiatzis Interactive Learning Environments 31 (1), 54-67, 2023 | 64 | 2023 |
| Ensemble learning using fuzzy weights to improve learning style identification for adapted instructional routines C Troussas, A Krouska, C Sgouropoulou, I Voyiatzis Entropy 22 (7), 735, 2020 | 57 | 2020 |
| A low-cost concurrent BIST scheme for increased dependability I Voyiatzis, C Halatsis IEEE Transactions on Dependable and Secure Computing 2 (2), 150-156, 2005 | 53 | 2005 |
| Xgboost and deep neural network comparison: The case of teams’ performance F Giannakas, C Troussas, A Krouska, C Sgouropoulou, I Voyiatzis Intelligent Tutoring Systems: 17th International Conference, ITS 2021 …, 2021 | 45 | 2021 |
| An efficient built-in self test method for robust path delay fault testing I Voyiatzis, A Paschalis, D Nikolos, C Halatsis Journal of Electronic Testing 8, 219-222, 1996 | 44 | 1996 |
| An input vector monitoring concurrent BIST architecture based on a precomputed test set I Voyiatzis, A Paschalis, D Gizopoulos, C Halatsis, FS Makri, ... IEEE Transactions on Computers 57 (8), 1012-1022, 2008 | 42 | 2008 |
| Accumulator-based test generation for robust sequential fault testing in DSP cores in near-optimal time I Voyiatzis, D Gizopoulos, A Paschalis IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (9 …, 2005 | 41 | 2005 |
| R-CBIST: An effective RAM-based input vector monitoring concurrent BIST technique I Voyiatzis, A Paschalis, D Nikolos, C Halatsis Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 34 | 1998 |
| Test vector embedding into accumulator-generated sequences: A linear-time solution I Voyiatzis IEEE Transactions on Computers 54 (4), 476-484, 2005 | 33 | 2005 |
| A concurrent BIST architecture based on monitoring square windows I Voyiatzis, T Haniotakis, C Efstathiou, H Antonopoulou 5th International Conference on Design & Technology of Integrated Systems in …, 2010 | 32 | 2010 |
| An accumulator-based compaction scheme for online BIST of RAMs I Voyiatzis IEEE transactions on very large scale integration (VLSI) systems 16 (9 …, 2008 | 29 | 2008 |
| Input vector monitoring concurrent BIST architecture using SRAM cells I Voyiatzis, C Efstathiou IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (7 …, 2013 | 28 | 2013 |
| Accumulator based 3-weight pattern generation A Paschalis, I Voyiatzis, D Gizopoulos IEEE transactions on very large scale integration (VLSI) systems 20 (2), 357-361, 2011 | 28 | 2011 |
| Accumulator-based BIST approach for stuck-open and delay fault testing I Voyiatzis, A Paschalis, D Nikolos, C Halatsis Proceedings the European Design and Test Conference. ED&TC 1995, 431-435, 1995 | 28 | 1995 |
| Design and Implementation of an E-exam System Based on the Android Platform G Meletiou, I Voyiatzis, V Stavroulaki, C Sgouropoulou 2012 16th Panhellenic Conference on Informatics, 375-380, 2012 | 25 | 2012 |
| Recursive pseudo-exhaustive two-pattern generation I Voyiatzis, D Gizopoulos, A Paschalis IEEE transactions on very large scale integration (VLSI) systems 18 (1), 142-152, 2009 | 25 | 2009 |
| Accumulator-based weighted pattern generation I Voyiatzis, D Gizopoulos, A Paschalis 11th IEEE International On-Line Testing Symposium, 215-220, 2005 | 24 | 2005 |
| An ALU-based BIST scheme for word-organized RAMs I Voyiatzis IEEE Transactions on Computers 57 (5), 577-590, 2008 | 21 | 2008 |
