Eduardo Alves - Google Scholar

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Citations	13919	6242
h-index	54	33
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Co-authors

Nuno Pessoa BarradasInternational Atomic Energy Agency (IAEA); C2TN/DECN/IST/Universidade de LisboaVerified email at iaea.org
T. MonteiroDepartamento de Física e i3N, Universidade de AveiroVerified email at ua.pt
Filipe VazUniversidade do Minho, PortugalVerified email at fisica.uminho.pt
K. P. O'DonnellStrathclyde UniversityVerified email at strath.ac.uk
Sergio Manuel de Sousa PereiraCICECO and Physics Department University of AveiroVerified email at ua.pt
J.G. CorreiaSenior Researcher, IST-C2TN, Universidade de Lisboa, PortugalVerified email at tecnico.ulisboa.pt
Robert MartinProfessor of Physics, Strathclyde UniversityVerified email at strath.ac.uk
Luís CunhaAssistant Professor - Centre of Physics - University of MinhoVerified email at fisica.uminho.pt
Carlos MarquesSevenAir AcademyVerified email at itn.pt
Albano CavaleiroProfessor de Engenharia Mecânica, University of CoimbraVerified email at dem.uc.pt
Philippe GoudeauCNRSVerified email at univ-poitiers.fr
EMILIO NOGALES DIAZUniversidad Complutense de MadridVerified email at fis.ucm.es
Jari LikonenVTTVerified email at vtt.fi
Kalle HeinolaInternational Atomic Energy AgencyVerified email at helsinki.fi
Carlos José Macedo TavaresAssistant Professor, Center of Physics, University of Minho, PortugalVerified email at fisica.uminho.pt
Aleksandra Baron-WiechecThe Culham Centre for Fusion Energy (UKAEA)Verified email at ccfe.ac.uk
Jose MarquesCoordinating Researcher, Instituto Superior TecnicoVerified email at ctn.tecnico.ulisboa.pt
Patricia Almeida CarvalhoSenior scientist, SINTEF, NorwayVerified email at sintef.no
Elvira Fortunatoi3N/CENIMAT, Department of Materials Science, Faculty of Science and Technology, Universidade NOVAVerified email at fct.unl.pt
J. P. AraújoDepartamento de Fisica e Astronomia, Universidade do PortoVerified email at fc.up.pt

Eduardo Alves

Full Researcher, DECN, Instituto Superior Técnico, Universidade de Lisboa

Verified email at tecnico.ulisboa.pt

Charged particle interactions with solids ion beam analysis and materials processing


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Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping S Pereira, MR Correia, E Pereira, KP O’Donnell, E Alves, AD Sequeira, ... Applied physics letters 80 (21), 3913-3915, 2002	226	2002
Effect of post-annealing on the properties of copper oxide thin films obtained from the oxidation of evaporated metallic copper V Figueiredo, E Elangovan, G Goncalves, P Barquinha, L Pereira, ... Applied Surface Science 254 (13), 3949-3954, 2008	221	2008
Characterisation of Ti1− xSixNy nanocomposite films F Vaz, L Rebouta, P Goudeau, J Pacaud, H Garem, JP Riviere, ... Surface and Coatings Technology 133, 307-313, 2000	205	2000
Compositional pulling effects in In x Ga 1− x N/G a N layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study S Pereira, MR Correia, E Pereira, KP O’donnell, C Trager-Cowan, ... Physical Review B 64 (20), 205311, 2001	194	2001
Overview of the JET results in support to ITER X Litaudon, S Abduallev, M Abhangi, P Abreu, M Afzal, KM Aggarwal, ... Nuclear Fusion 57 (10), 102001, 2017	171*	2017
Anomalous ion channeling in AlInN/GaN bilayers: determination of the strain state K Lorenz, N Franco, E Alves, IM Watson, RW Martin, KP O’donnell Physical review letters 97 (8), 085501, 2006	166	2006
Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films F Vaz, J Ferreira, E Ribeiro, L Rebouta, S Lanceros-Méndez, JA Mendes, ... Surface and Coatings Technology 191 (2-3), 317-323, 2005	157	2005
Compositional dependence of the strain-free optical band gap in layers S Pereira, MR Correia, T Monteiro, E Pereira, E Alves, AD Sequeira, ... Applied physics letters 78 (15), 2137-2139, 2001	139	2001
Metal-organic vapor phase epitaxy and properties of AlInN in the whole compositional range C Hums, J Bläsing, A Dadgar, A Diez, T Hempel, J Christen, A Krost, ... Applied Physics Letters 90 (2), 022105, 2007	136	2007
Microstructure and mechanical properties of nanocomposite (Ti, Si, Al) N coatings S Carvalho, L Rebouta, A Cavaleiro, LA Rocha, J Gomes, E Alves Thin Solid Films 398, 391-396, 2001	127	2001
Structural, optical and mechanical properties of coloured TiNxOy thin films F Vaz, P Cerqueira, L Rebouta, SMC Nascimento, E Alves, P Goudeau, ... Thin Solid Films 447, 449-454, 2004	124	2004
Direct evidence for As as a Zn-site impurity in ZnO U Wahl, E Rita, JG Correia, AC Marques, E Alves, JC Soares, ... Physical review letters 95 (21), 215503, 2005	119	2005
Structural and optical properties of InGaN/GaN layers close to the critical layer thickness S Pereira, MR Correia, E Pereira, C Trager-Cowan, F Sweeney, ... Applied physics letters 81 (7), 1207-1209, 2002	119	2002
Effects of ion bombardment on properties of dc sputtered superhard (Ti, Si, Al) N nanocomposite coatings E Ribeiro, A Malczyk, S Carvalho, L Rebouta, JV Fernandes, E Alves, ... Surface and Coatings Technology 151, 515-520, 2002	116	2002
Photoluminescence and lattice location of Eu and Pr implanted GaN samples T Monteiro, C Boemare, MJ Soares, RAS Ferreira, LD Carlos, K Lorenz, ... Physica B: Condensed Matter 308, 22-25, 2001	112	2001
Damage formation and annealing at low temperatures in ion implanted ZnO K Lorenz, E Alves, E Wendler, O Bilani, W Wesch, M Hayes Applied Physics Letters 87 (19), 191904, 2005	111	2005
Selectively excited photoluminescence from Eu-implanted GaN K Wang, RW Martin, KP O’Donnell, V Katchkanov, E Nogales, K Lorenz, ... Applied Physics Letters 87 (11), 112107, 2005	109	2005
Materials design data for reduced activation martensitic steel type EUROFER AAF Tavassoli, A Alamo, L Bedel, L Forest, JM Gentzbittel, JW Rensman, ... Journal of nuclear materials 329, 257-262, 2004	109	2004
Beam Interactions with Materials and Atoms E ALVES, W ASSMANN, V BIRYUKOV, E BRINGA, B DEV, PL GRANDE, ...	106
Photoluminescence studies in ZnO samples C Boemare, T Monteiro, MJ Soares, JG Guilherme, E Alves Physica B: Condensed Matter 308, 985-988, 2001	105	2001

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