A simulator of small-delay faults caused by resistive-open defects A Czutro, N Houarche, P Engelke, I Polian, M Comte, M Renovell, ... 2008 13th European Test Symposium, 113-118, 2008 | 67 | 2008 |
Making predictive analog/RF alternate test strategy independent of training set size H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell 2012 IEEE International Test Conference, 1-9, 2012 | 51 | 2012 |
Smart selection of indirect parameters for DC-based alternate RF IC testing H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ... 2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012 | 46 | 2012 |
A new methodology for ADC test flow optimization S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell International Test Conference, 201-209, 2003 | 29 | 2003 |
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies S Larguech, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell Microelectronics Journal 46 (11), 1091-1102, 2015 | 23 | 2015 |
Securing color information of an image by concealing the color palette M Chaumont, W Puech, C Lahanier Journal of Systems and Software 86 (3), 809-825, 2013 | 22 | 2013 |
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell IEEE Design & Test of Computers 23 (3), 234-243, 2006 | 21 | 2006 |
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell IEEE Design & Test of Computers 23 (3), 234-243, 2006 | 21 | 2006 |
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations A Karel, M Comte, JM Galliere, F Azais, M Renovell 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016 | 17 | 2016 |
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations A Karel, M Comte, JM Galliere, F Azais, M Renovell 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016 | 17 | 2016 |
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? H El Badawi, F Azaïs, S Bernard, M Comte, V Kerzérho, F Lefevre 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 16 | 2019 |
MIRID: Mixed-mode IR-drop induced delay simulator J Jiang, M Aparicio, M Comte, F Azaïs, M Renovell, I Polian 2013 22nd Asian Test Symposium, 177-182, 2013 | 16 | 2013 |
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC V Kerzérho, S Bernard, F Azaïs, M Comte, O Potin, C Shan, G Bontorin, ... Microelectronics Journal 44 (9), 840-843, 2013 | 14 | 2013 |
" Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC V Kerzerho, P Cauvet, S Bernard, F Azaïs, M Comte, M Renovell Eleventh IEEE European Test Symposium (ETS'06), 159-164, 2006 | 14 | 2006 |
" Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC V Kerzerho, P Cauvet, S Bernard, F Azaïs, M Comte, M Renovell Eleventh IEEE European Test Symposium (ETS'06), 159-164, 2006 | 14 | 2006 |
Correlation between static and dynamic parameters of A-to-D converters: in the view of a unique test procedure F Azaïs, S Bernard, Y Bertrand, M Comte, M Renovell Journal of Electronic Testing 20 (4), 375-387, 2004 | 14 | 2004 |
Efficiency of spectral-based ADC test flows to detect static errors S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell Journal of Electronic Testing 20 (3), 257-267, 2004 | 13 | 2004 |
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect A Karel, M Comte, JM Galliere, F Azais, M Renovell 2016 17th Latin-American Test Symposium (LATS), 129-134, 2016 | 12 | 2016 |
A generic methodology for building efficient prediction models in the context of alternate testing S Larguech, F Azaïs, S Bernard, M Comte, V Kerzerho, M Renovell 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW), 1-6, 2015 | 12 | 2015 |
Resistive bridging defect detection in bulk, fdsoi and finfet technologies A Karel, M Comte, JM Galliere, F Azais, M Renovell Journal of Electronic Testing 33, 515-527, 2017 | 10 | 2017 |