Shupeng Sun
Shupeng Sun
Verified email at cmu.edu
Title
Cited by
Cited by
Year
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data
F Wang, P Cachecho, W Zhang, S Sun, X Li, R Kanj, C Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
792015
Efficient SRAM failure rate prediction via Gibbs sampling
S Sun, Y Feng, C Dong, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
752012
Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space
S Sun, X Li, H Liu, K Luo, B Gu
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions …, 2015
582015
Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space
S Sun, X Li, H Liu, K Luo, B Gu
International Conference On Computer Aided Design, 478-485, 2013
582013
Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion
X Li, W Zhang, F Wang, S Sun, C Gu
2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 627-634, 2012
362012
Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space
S Sun, X Li
2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 324-331, 2014
322014
Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits
X Li, F Wang, S Sun, C Gu
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 795-802, 2013
272013
Indirect performance sensing for on-chip self-healing of analog and RF circuits
S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (8), 2243-2252, 2014
262014
Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion
S Sun, F Wang, S Yaldiz, X Li, L Pileggi, A Natarajan, M Ferriss, ...
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013
232013
Machine learning for noise sensor placement and full-chip voltage emergency detection
X Liu, S Sun, X Li, H Qian, P Zhou
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
92016
Improved GPSR in inter-vehicle communication
S Sun, J Hu, X Luo, Q Wang
2010 International Conference on Communications and Mobile Computing 2, 259-265, 2010
92010
A statistical methodology for noise sensor placement and full-chip voltage map generation
X Liu, S Sun, P Zhou, X Li, H Qian
Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015
62015
Sparse regression driven mixture importance sampling for memory design
M Malik, RV Joshi, R Kanj, S Sun, H Homayoun, T Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (1), 63-72, 2017
32017
Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits
S Sun, X Li, C Gu
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 1-4, 2013
32013
Large-scale circuit performance modeling by bayesian model fusion
J Tao, F Wang, P Cachecho, W Zhang, S Sun, X Li, R Kanj, C Gu, X Zeng
Machine Learning in VLSI Computer-Aided Design, 403-422, 2019
22019
Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space
S Sun, X Li
2015 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2015
22015
Fast Statistical Analysis of Rare Failure Events for SRAM Circuits in High-Dimensional Variation Space
S Sun
Ph. D. Dissertation, Carnegie Mellon University, 2015
12015
Fast Statistical Analysis of Rare Circuit Failure Events
J Tao, S Sun, X Li, H Liu, K Luo, B Gu, X Zeng
Machine Learning in VLSI Computer-Aided Design, 349-373, 2019
2019
2015 PHIL KAUFMAN AWARD FOR DISTINGUISHED CONTRIBUTIONS TO EDA
W Rhines, A Cirkel, K Ramamritham, XS Hu, J Hu, P Li, C Rowen, S Sun, ...
Space 34 (7), 1096-1109, 2015
2015
Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space
S Sun, X Li
The 20th Asia and South Pacific Design Automation Conference, 302-307, 2015
2015
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Articles 1–20