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A case study of IR-drop in structured at-speed testing
J Saxena, KM Butler, VB Jayaram, S Kundu, NV Arvind, P Sreeprakash, ...
International Test Conference, 2003. Proceedings. ITC 2003., 1098-1098, 2003
5232003
Minimizing power consumption in scan testing: Pattern generation and DFT techniques
KM Butler, J Saxena, A Jain, T Fryars, J Lewis, G Hetherington
2004 International Conferce on Test, 355-364, 2004
3632004
An analysis of power reduction techniques in scan testing
J Saxena, KM Butler, L Whetsel
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 670-677, 2001
2052001
A case study on the implementation of the Illinois scan architecture
FF Hsu, KM Butler, JH Patel
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 538-547, 2001
1782001
Scan-based transition fault testing-implementation and low cost test challenges
J Saxena, KM Butler, J Gatt, R Raghuraman, SP Kumar, S Basu, ...
Proceedings. International Test Conference, 1120-1129, 2002
1692002
REDO-random excitation and deterministic observation-first commercial experiment
MR Grimaila, S Lee, J Dworak, KM Butler, B Stewart, H Balachandran, ...
Proceedings 17th IEEE VLSI Test Symposium (Cat. No. PR00146), 268-274, 1999
1461999
Heuristics to compute variable orderings for efficient manipulation of ordered binary decision diagrams
KM Butler, DE Ross, R Kapur, MR Mercer
Proceedings of the 28th ACM/IEEE Design Automation Conference, 417-420, 1991
1361991
Power supply noise: A survey on effects and research
M Tehranipoor, KM Butler
IEEE Design & Test of Computers 27 (2), 51-67, 2010
992010
Defect-oriented testing and defective-part-level prediction
J Dworak, JD Wicker, S Lee, MR Grimaila, MR Mercer, KM Butler, ...
IEEE Design & Test of Computers 18 (1), 31-41, 2001
742001
System and method for structurally testing integrated circuit devices
KM Butler, TJ Powell
US Patent 5,694,402, 1997
731997
Quantifying non-target defect detection by target fault test sets
KM Butler, MR Mercer
Proc. European Test Conference, 91-100, 1991
721991
Fast functional evaluation of candidate OBDD variable orderings
DE Ross, KM Butler, R Kapur, MR Mercer
Proceedings of the European Conference on Design Automation., 4-10, 1991
551991
Quality improvement and cost reduction using statistical outlier methods
A Nahar, KM Butler, JM Carulli, C Weinberger
2009 IEEE International Conference on Computer Design, 64-69, 2009
492009
Test cost reduction through performance prediction using virtual probe
HM Chang, KT Cheng, W Zhang, X Li, KM Butler
2011 IEEE International Test Conference, 1-9, 2011
472011
Local at-speed scan enable generation for transition fault testing using low-cost testers
N Ahmed, M Tehranipoor, CP Ravikumar, KM Butler
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
462007
Test data analytics—Exploring spatial and test-item correlations in production test data
CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler
2013 IEEE International Test Conference (ITC), 1-10, 2013
422013
Correlation of logical failures to a suspect process step
H Balachandran, J Parker, D Shupp, S Butler, KM Butler, C Force, J Smith
International Test Conference 1999. Proceedings (IEEE Cat. No. 99CH37034 …, 1999
401999
CATAPULT: Concurrent automatic testing allowing parallelization and using limited topology
RK Gaede, MR Mercer, K Butler, DE Ross
25th ACM/IEEE, Design Automation Conference. Proceedings 1988., 597-600, 1988
401988
Bridging fault diagnosis in the absence of physical information
DB Lavo, B Chess, T Larrabee, FJ Ferguson, J Saxena, KM Butler
Proceedings International Test Conference 1997, 887-893, 1997
381997
Assessing fault model and test quality
KM Butler, MR Mercer
Springer Science & Business Media, 2012
362012
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