Jose S. Matos
Jose S. Matos
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A boundary scan test controller for hierarchical BIST
JS Matos, FS Pinto, JMM Ferreira
Test Conference, 1992. Proceedings., International, 217, 1995
331995
A boundary scan test controller for hierarchical BIST
JMM Ferreira, FS Pinto, JS Matos
Proceedings of the IEEE International Test Conference on Discover the New …, 1992
33*1992
Control and observation of analog nodes in mixed-signal boards
JS Matos, AC Leão, JC Ferreira
Test Conference, 1993. Proceedings., International, 323-331, 1993
311993
Cross-correlation between iDD and vOUT signals for testing analogue circuits
JM da Silva, JS Matos, IM Bell, GE Taylor
Electronics Letters 31 (19), 1617-1618, 1995
191995
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
JM Da Silva, JS Matos, IM Bell, GE Taylor
Journal of Electronic Testing 9 (1-2), 75-88, 1996
161996
Boundary scan test, test methodology, and fault modeling
F De Jong, JS Matos, JM Ferreira
Journal of Electronic Testing 2 (1), 77-88, 1991
151991
Automatic generation of a single-chip solution for board-level BIST of boundary scan boards
JMM Ferreira, JS Matos, FS Pinto
Design Automation, 1992. Proceedings.,[3rd] European Conference on, 154-158, 1992
141992
RVC - A Reconfigurable Coprocessor for Vector Processing Applications
JC Alves, JS Matos
Proceedings of the IEEE Symposium on Field-Programmable Custom Computing …, 1998
131998
Binary decision diagrams: From abstract representations to physical implementations
JS Matos, JV Oldfield
Proceedings of the 20th Design Automation Conference, 567-570, 1983
121983
A comparison of ADC dynamic test methods
HS Mendonça, JM Silva, JS Matos
Proc. Design of Circuits and Integrated Systems Conference, 102-107, 2000
112000
Evaluation of i DD/v OUT cross-correlation for mixed current-voltage testing of analogue and mixed-signal circuits
JM Da Silva, JS Matos
European Design and Test Conference, 1996. ED&TC 96. Proceedings, 264-268, 1996
101996
Scalable hardware architecture for disparity map computation and object location in real-time
PM Santos, JC Ferreira, JS Matos
Journal of Real-Time Image Processing, 1-13, 2013
52013
Design for Embedded Testing of an LNA
JM da Silva, A Pinho, JS Matos
XX Design of Circuits and Integrated Systems, 2005
52005
Functional in-circuit characterisation of ΣΔ modulators
JM da Silva, JS Duarte, JS Matos
Measurement 32 (4), 257-264, 2002
52002
ADC testing using joint time–frequency analysis
H Mendonça, JM da Silva, JS Matos
Computer Standards & Interfaces 23 (2), 129-135, 2001
52001
Mixed-signal BIST using correlation and reconfigurable hardware
JM da Silva, JS Duarte, JS Matos
Design, Automation and Test in Europe Conference and Exhibition 2000 …, 2000
52000
Architecture of test support ICs for mixed-signal testing
JS Matos, JC Ferreira, AC Leão, JM Silva
VLSI Test Symposium, 1994. Proceedings., 12th IEEE, 240-246, 1994
51994
Computing ADC harmonic content from a reduced number of values
HS Mendonça, JM da Silva, JS Matos
Instrumentation and Measurement Technology Conference, 2003. IMTC'03 …, 2003
42003
A tool for fault extraction in pcbs
LC Laranjeira, JM da Silva, JS Matos
Proc. European Test Workshop 2000, 2000
42000
Flexible hardware acceleration for nesting problems
JC Ferreira, JC Alves, C Albuquerque, JF Oliveira, JS Ferreira, JS Matos
Electronics, Circuits and Systems, 1998 IEEE International Conference on 1 …, 1998
41998
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