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Piotr D. Szyperski
Piotr D. Szyperski
Wrocław University of Science and Technology
Verified email at pwr.edu.pl
Title
Cited by
Cited by
Year
Comparative study on fractal analysis of interferometry images with application to tear film surface quality assessment
PD Szyperski
Applied optics 57 (16), 4491-4498, 2018
52018
New approaches to fractal dimension estimation with application to gray-scale images
PD Szyperski, DR Iskander
IEEE Access 8, 1383-1393, 2019
32019
A novel phase-based approach to tear film surface quality assessment using lateral shearing interferometry
P Szyperski, DR Iskander
Computer Information Systems and Industrial Management: 14th IFIP TC 8 …, 2015
12015
Exploiting the phase domain of lateral shearing interferometry in measurements of tear film surface quality
DH Szczesna-Iskander, P Szyperski
7th European / 1st World Meeting in Visual and Physiological Optics, 345-348, 2014
2014
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Articles 1–4