| Decor: A method for the specification and detection of code and design smells N Moha, YG Gueheneuc, L Duchien, AF Le Meur IEEE Transactions on Software Engineering 36 (1), 20-36, 2009 | 606 | 2009 |
| Feature location using probabilistic ranking of methods based on execution scenarios and information retrieval D Poshyvanyk, YG Gueheneuc, A Marcus, G Antoniol, V Rajlich IEEE Transactions on Software Engineering 33 (6), 420-432, 2007 | 458 | 2007 |
| Is it a bug or an enhancement?: a text-based approach to classify change requests. G Antoniol, K Ayari, M Di Penta, F Khomh, YG Guéhéneuc CASCON 8, 304-318, 2008 | 326 | 2008 |
| An exploratory study of the impact of code smells on software change-proneness F Khomh, M Di Penta, YG Gueheneuc 2009 16th Working Conference on Reverse Engineering, 75-84, 2009 | 255 | 2009 |
| An exploratory study of the impact of antipatterns on class change-and fault-proneness F Khomh, M Di Penta, YG Guéhéneuc, G Antoniol Empirical Software Engineering 17 (3), 243-275, 2012 | 245 | 2012 |
| An empirical study of the impact of two antipatterns, blob and spaghetti code, on program comprehension M Abbes, F Khomh, YG Gueheneuc, G Antoniol 2011 15th European Conference on Software Maintenance and Reengineering, 181-190, 2011 | 231 | 2011 |
| Demima: A multilayered approach for design pattern identification YG Guéhéneuc, G Antoniol IEEE Transactions on Software Engineering 34 (5), 667-684, 2008 | 191 | 2008 |
| A bayesian approach for the detection of code and design smells F Khomh, S Vaucher, YG Guéhéneuc, H Sahraoui 2009 Ninth International Conference on Quality Software, 305-314, 2009 | 185 | 2009 |
| Fingerprinting design patterns YG Guéhéneuc, H Sahraoui, F Zaidi 11th Working Conference on Reverse Engineering, 172-181, 2004 | 183 | 2004 |
| Cerberus: Tracing requirements to source code using information retrieval, dynamic analysis, and program analysis M Eaddy, AV Aho, G Antoniol, YG Guéhéneuc 2008 16th IEEE International Conference on Program Comprehension, 53-62, 2008 | 161 | 2008 |
| Combining probabilistic ranking and latent semantic indexing for feature identification D Poshyvanyk, A Marcus, V Rajlich, YG Gueheneuc, G Antoniol 14th IEEE International Conference on Program Comprehension (ICPC'06), 137-148, 2006 | 151 | 2006 |
| Instantiating and detecting design patterns: Putting bits and pieces together H Albin-Amiot, P Cointe, YG Guéhéneuc, N Jussien Proceedings 16th Annual International Conference on Automated Software …, 2001 | 135 | 2001 |
| Feature identification: a novel approach and a case study G Antoniol, YG Guéhéneuc 21st IEEE International Conference on Software Maintenance (ICSM'05), 357-366, 2005 | 134 | 2005 |
| Recovering binary class relationships: Putting icing on the UML cake YG Guéhéneuc, H Albin-Amiot ACM SIGPLAN Notices 39 (10), 301-314, 2004 | 133 | 2004 |
| Aura: a hybrid approach to identify framework evolution W Wu, YG Guéhéneuc, G Antoniol, M Kim 2010 ACM/IEEE 32nd International Conference on Software Engineering 1, 325-334, 2010 | 124 | 2010 |
| Feature identification: An epidemiological metaphor G Antoniol, YG Guéhéneuc IEEE Transactions on Software Engineering 32 (9), 627-641, 2006 | 106 | 2006 |
| BDTEX: A GQM-based Bayesian approach for the detection of antipatterns F Khomh, S Vaucher, YG Guéhéneuc, H Sahraoui Journal of Systems and Software 84 (4), 559-572, 2011 | 103 | 2011 |
| Do design patterns impact software quality positively? F Khomh, YG Gueheneuce 2008 12th European Conference on Software Maintenance and Reengineering, 274-278, 2008 | 101 | 2008 |
| Meta-modeling design patterns: Application to pattern detection and code synthesis H Albin-Amiot, YG Guéhéneuc Proceedings of ECOOP Workshop on Automating Object-Oriented Software …, 2001 | 86 | 2001 |
| Using design patterns and constraints to automate the detection and correction of inter-class design defects YG Guéhéneuc, H Albin-Amiot Proceedings 39th International Conference and Exhibition on Technology of …, 2001 | 85 | 2001 |
Giuliano (Giulio) AntoniolProfessor at DGIGL -- Polytechnique MontréalEmail confirmado em ieee.org
