Lithiation-induced amorphization of Pd3 P2 S8 for highly efficient hydrogen evolution X Zhang, Z Luo, P Yu, Y Cai, Y Du, D Wu, S Gao, C Tan, Z Li, M Ren, ...
Nature Catalysis 1 (6), 460-468, 2018
252 2018 Novel epitaxial nickel aluminide-silicide with low Schottky-barrier and series resistance for enhanced performance of dopant-segregated source/drain N-channel MuGFETs RTP Lee, TY Liow, KM Tan, AEJ Lim, CS Ho, KM Hoe, MY Lai, ...
2007 IEEE Symposium on VLSI Technology, 108-109, 2007
234 2007 The National University of Singapore high energy ion nano-probe facility: Performance tests F Watt, JA Van Kan, I Rajta, AA Bettiol, TF Choo, MBH Breese, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2003
210 2003 Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study MP Seah, SJ Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, ...
Surface and Interface Analysis: An International Journal devoted to the …, 2004
197 2004 Improvement of dielectric loss tangent of doped thin films for tunable microwave devices KB Chong, LB Kong, L Chen, L Yan, CY Tan, T Yang, CK Ong, ...
Journal of Applied Physics 95 (3), 1416-1419, 2004
134 2004 Thermal stability study of NiSi and NiSi2 thin films FF Zhao, JZ Zheng, ZX Shen, T Osipowicz, WZ Gao, LH Chan
Microelectronic engineering 71 (1), 104-111, 2004
126 2004 Nanoflake CoN as a high capacity anode for Li-ion batteries B Das, MV Reddy, P Malar, T Osipowicz, GVS Rao, BVR Chowdari
Solid State Ionics 180 (17-19), 1061-1068, 2009
122 2009 The National University of Singapore nuclear microscope facility F Watt, I Orlic, KK Loh, CH Sow, P Thong, SC Liew, T Osipowicz, TF Choo, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1994
102 1994 World-wide lightning location using VLF propagation in the Earth-ionosphere waveguide RL Dowden, RH Holzworth, CJ Rodger, J Lichtenberger, NR Thomson, ...
IEEE Antennas and Propagation Magazine 50 (5), 40-60, 2008
94 2008 Micromachining using deep ion beam lithography SV Springham, T Osipowicz, JL Sanchez, LH Gan, F Watt
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997
94 1997 Micro‐Raman Spectroscopy Investigation of Nickel Silicides and Nickel (Platinum) Silicides PS Lee, D Mangelinck, KL Pey, ZX Shen, J Ding, T Osipowicz, A See
Electrochemical and Solid-State Letters 3 (3), 153, 2000
91 2000 Formation and thermal stability of nickel germanide on germanium substrate Q Zhang, N Wu, T Osipowicz, LK Bera, C Zhu
Japanese Journal of Applied Physics 44 (10L), L1389, 2005
89 2005 Structural and photoluminescence properties of Gd implanted ZnO single crystals PP Murmu, RJ Mendelsberg, J Kennedy, DA Carder, BJ Ruck, A Markwitz, ...
Journal of Applied Physics 110 (3), 2011
84 2011 Resist materials for proton micromachining JA Van Kan, JL Sanchez, B Xu, T Osipowicz, F Watt
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
78 1999 Micromachining using focused high energy ion beams: Deep Ion Beam Lithography JA Van Kan, JL Sanchez, B Xu, T Osipowicz, F Watt
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999
74 1999 Frozen target measurements of the 430 keV 15 N(p,αψ) resonance T Osipowicz, KP Lieb, S Brüssermann
Nuclear Instruments and Methods in Physics Research B 18 (1), 232-235, 1986
71 1986 Diamond-like film as a corrosion protective layer on the hard disk B Tomcik, T Osipowicz, JY Lee
Thin Solid Films 360 (1-2), 173-180, 2000
70 2000 Nano-imaging of single cells using STIM R Minqin, JA Van Kan, AA Bettiol, L Daina, CY Gek, BB Huat, HJ Whitlow, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
58 2007 Hydrogenated amorphous silicon carbide deposition using electron cyclotron resonance chemical vapor deposition under high microwave power and strong hydrogen dilution K Chew, Rusli, SF Yoon, J Ahn, V Ligatchev, EJ Teo, T Osipowicz, F Watt
Journal of Applied Physics 92 (5), 2937-2941, 2002
58 2002 Surface analysis of GaN decomposition HW Choi, MA Rana, SJ Chua, T Osipowicz, JS Pan
Semiconductor science and technology 17 (12), 1223, 2002
55 2002