Alexander Shard

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ian gilmoreNational Physical Laboratory, Natl Phys lab, Nat Phys labEmail confirmado em npl.co.uk
Caterina MinelliPrincipal Research Scientist, National Physical LaboratoryEmail confirmado em npl.co.uk
Martin SeahNational Physical LaboratoryEmail confirmado em npl.co.uk
Cuong Ton-ThatAssociate Professor, University of Technology SydneyEmail confirmado em uts.edu.au
V.R.DhanakPhysics Department, University of LiverpoolEmail confirmado em liverpool.ac.uk
Morgan R AlexanderUniversity of NottinghamEmail confirmado em nottingham.ac.uk
Rasmus HavelundLillebaelt Hospital, Vejle, DenmarkEmail confirmado em rsyd.dk
Santanu RayCeres Power Ltd.Email confirmado em cerespower.com
Li YangXi'an Jiaotong-Liverpool UniversityEmail confirmado em xjtlu.edu.cn
David J H CantNational Physical Laboratory UKEmail confirmado em npl.co.uk
David ScurrUniversity of NottinghamEmail confirmado em nottingham.ac.uk
Felicia M GreenNational Physical LaboratoryEmail confirmado em npl.co.uk
Saul TendlerUniversity of YorkEmail confirmado em york.ac.uk
Kevin ShakesheffOpen UniversityEmail confirmado em nottingham.ac.uk
Clive RobertsProfessor of Pharmaceutical Nanotechnology, School of Pharmacy, The University of NottinghamEmail confirmado em Nottingham.ac.uk
Sally L McArthurProfessor of Biomedical Engineering, Swinburne University of TechnologyEmail confirmado em swin.edu.au
Rob ShortPro Vice Chancellor, IT, Engineering & the Environment, UniversityEmail confirmado em unisa.edu.au
Wolfgang Unger, BAM Federal Institut...Director and Professor, Division "Surface Analysis and Interfacial Chemistry" (em.)Email confirmado em alumni.hu-berlin.de
Paula EvesDrEmail confirmado em lincoln.ac.uk
Cedric PowellNational Institute of Standards and TechnologyEmail confirmado em nist.gov

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Alexander Shard

NPL Fellow, National Physical Laboratory

Email confirmado em npl.co.uk

Surface Analysis


Título Ordenar por citações Ordenar por ano Ordenar por título	Citado por Citado por	Ano
Effect of crystallization on the electronic energy levels and thin film morphology of P3HT: PCBM blends WC Tsoi, SJ Spencer, L Yang, AM Ballantyne, PG Nicholson, A Turnbull, ... Macromolecules 44 (8), 2944-2952, 2011	281	2011
ARXPS characterisation of plasma polymerised surface chemical gradients KL Parry, AG Shard, RD Short, RG White, JD Whittle, A Wright Surface and Interface Analysis: An International Journal devoted to the …, 2006	280	2006
XPS and AFM surface studies of solvent-cast PS/PMMA blends C Ton-That, AG Shard, DOH Teare, RH Bradley Polymer 42 (3), 1121-1129, 2001	233	2001
Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays AG Shard Surface and Interface Analysis 46 (3), 175-185, 2014	185	2014
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard Analytical chemistry 82 (1), 98-105, 2010	168	2010
Emerging techniques for submicrometer particle sizing applied to Stober silica NC Bell, C Minelli, J Tompkins, MM Stevens, AG Shard Langmuir 28 (29), 10860-10872, 2012	163	2012
A NEXAFS examination of unsaturation in plasma polymers of allylamine and propylamine G Alexander, JD Whittle, AJ Beck, PN Brookes, NA Bullett, RA Talib, ... The Journal of Physical Chemistry B 108 (33), 12472-12480, 2004	160	2004
Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ... Analytical chemistry 84 (18), 7865-7873, 2012	153	2012
Effects of annealing on the surface composition and morphology of PS/PMMA blend C Ton-That, AG Shard, R Daley, RH Bradley Macromolecules 33 (22), 8453-8459, 2000	149	2000
Thickness of spin-cast polymer thin films determined by angle-resolved XPS and AFM tip-scratch methods C Ton-That, AG Shard, RH Bradley Langmuir 16 (5), 2281-2284, 2000	142	2000
Measurement of sputtering yields and damage in C₆₀ SIMS depth profiling of model organic materials AG Shard, PJ Brewer, FM Green, IS Gilmore Surface and Interface Analysis: An International Journal devoted to the …, 2007	141	2007
Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS G Alexander, FM Green, PJ Brewer, MP Seah, IS Gilmore The Journal of Physical Chemistry B 112 (9), 2596-2605, 2008	136	2008
Quantitative analysis of adsorbed proteins by X-ray photoelectron spectroscopy S Ray, AG Shard Analytical chemistry 83 (22), 8659-8666, 2011	128	2011
A straightforward method for interpreting XPS data from core–shell nanoparticles AG Shard The Journal of Physical Chemistry C 116 (31), 16806-16813, 2012	126	2012
Synthesis and characterization of segmented polyurethanes based on amphiphilic polyether diols PN Lan, S Corneillie, E Schacht, M Davies, A Shard Biomaterials 17 (23), 2273-2280, 1996	109	1996
Surface analysis of biodegradable polymer blends of poly (sebacic anhydride) and poly (DL-lactic acid) MC Davies, KM Shakesheff, AG Shard, A Domb, CJ Roberts, SJB Tendler, ... Macromolecules 29 (6), 2205-2212, 1996	105	1996
Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements DR Baer, K Artyushkova, C Richard Brundle, JE Castle, MH Engelhard, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 37 (3 …, 2019	94	2019
Surface feature size of spin cast PS/PMMA blends C Ton-That, AG Shard, RH Bradley Polymer 43 (18), 4973-4977, 2002	93	2002
Size and ζ-potential measurement of silica nanoparticles in serum using tunable resistive pulse sensing A Sikora, AG Shard, C Minelli Langmuir 32 (9), 2216-2224, 2016	86	2016
Quantitation of IgG protein adsorption to gold nanoparticles using particle size measurement NC Bell, C Minelli, AG Shard Analytical Methods 5 (18), 4591-4601, 2013	85	2013

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