| Low-cost alternate EVM test for wireless receiver systems A Halder, A Chatterjee VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, 255-260, 2005 | 211 | 2005 |
| Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs SS Akbay, A Halder, A Chatterjee, D Keezer IEEE Transactions on advanced packaging 27 (2), 352-363, 2004 | 105 | 2004 |
| A system-level alternate test approach for specification test of RF transceivers in loopback mode A Halder, S Bhattacharya, G Srinivasan, A Chatterjee VLSI Design, 2005. 18th International Conference on, 289-294, 2005 | 102 | 2005 |
| Automatic multitone alternate test generation for RF circuits using behavioral models A Halder, S Bhattacharya, A Chatterjee 2013 IEEE International Test Conference (ITC), 665-665, 2003 | 90 | 2003 |
| Alternate testing of RF transceivers using optimized test stimulus for accurate prediction of system specifications S Bhattacharya, A Halder, G Srinivasan, A Chatterjee Journal of Electronic Testing 21 (3), 323-339, 2005 | 58 | 2005 |
| Low-cost production testing of wireless transmitters A Halder, A Chatterjee 19th International Conference on VLSI Design held jointly with 5th …, 2006 | 26 | 2006 |
| System-level testing of RF transmitter specifications using optimized periodic bitstreams S Bhattacharya, G Srinivasan, S Cherubal, A Halder, A Chatterjee 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 229-234, 2004 | 22 | 2004 |
| System-level specification testing of wireless transceivers A Halder, S Bhattacharya, A Chatterjee IEEE transactions on very large scale integration (VLSI) systems 16 (3), 263-276, 2008 | 21 | 2008 |
| Systems and methods for testing integrated circuits A Halder, A Chatterjee US Patent 7,032,151, 2006 | 20 | 2006 |
| Automated test generation and test point selection for specification test of analog circuits A Halder, A Chatterjee International Symposium on Signals, Circuits and Systems. Proceedings, SCS …, 2004 | 20 | 2004 |
| A Variable RF Carrier Modulation Scheme for Ultralow Power Wireless Body-Area Network A Ghosh, A Halder, AS Dhar IEEE Systems Journal 6 (2), 305-316, 2012 | 15 | 2012 |
| Test generation for specification test of analog circuits using efficient test response observation methods A Halder, A Chatterjee Microelectronics journal 36 (9), 820-832, 2005 | 15 | 2005 |
| Specification based digital compatible built-in test of embedded analog circuits A Halder, A Chatterjee Proceedings 10th Asian Test Symposium, 344-349, 2001 | 15 | 2001 |
| Efficient Alternate Test Generation for RF Transceiver Architectures A Halder Georgia Institute of Technology, 2006 | 12 | 2006 |
| Loopback test of RF transceivers using periodic bit sequences: An alternate test approach G Srinivasan, A Halder, S Bhattacharya, A Chatterjee International Mixed-Signal Test Workshop, 2004 | 11 | 2004 |
| Test elimination using redundancy analysis for specification test of analog circuits D Han, A Halder, A Chatterjee 10th IEEE International Mixed Signal Testing Workshop, 69-75, 2004 | 9 | 2004 |
| Low-cost production test of BER for wireless receivers A Halder, A Chatterjee Test Symposium, 2005. Proceedings. 14th Asian, 64-69, 2005 | 8 | 2005 |
| An ultra-low power symbol detection methodology and its circuit implementation for a wake-up receiver in wireless sensor nodes DK Meher, A Salimath, A Halder 2012 25th International Conference on VLSI Design, 274-279, 2012 | 7 | 2012 |
| A 1 V, Sub-mW CMOS LNA for Low-Power 1 GHz Wide-Band Wireless Applications A Salimath, P Karamcheti, A Halder 2014 27th International Conference on VLSI Design and 2014 13th …, 2014 | 5 | 2014 |
| An ultra low power MICS/ISM band transmitter in 0.18 μm CMOS A Ghosh, AS Dhar, A Halder 18th International Symposium on VLSI Design and Test, 1-6, 2014 | 3 | 2014 |
