TEM observation of crack-and pit-shaped defects in electrically degraded GaN HEMTs U Chowdhury, JL Jimenez, C Lee, E Beam, P Saunier, T Balistreri, ...
IEEE Electron Device Letters 29 (10), 1098-1100, 2008
198 2008 Measurement of channel temperature in GaN high-electron mobility transistors J Joh, JA Del Alamo, U Chowdhury, TM Chou, HQ Tserng, JL Jimenez
IEEE Transactions on Electron Devices 56 (12), 2895-2901, 2009
184 2009 Self-consistent calculation of the electronic structure and electron–electron interaction in self-assembled InAs-GaAs quantum dot structures LRC Fonseca, JL Jimenez, JP Leburton, RM Martin
Physical Models for Quantum Dots, 561-587, 2021
148 2021 Physical degradation of GaN HEMT devices under high drain bias reliability testing SY Park, C Floresca, U Chowdhury, JL Jimenez, C Lee, E Beam, ...
Microelectronics Reliability 49 (5), 478-483, 2009
130 2009 Electronic Coupling in InAs/GaAs Self-Assembled Stacked Double Quantum Dot Systems LRC Fonseca, JL Jimenez, JP Leburton
Physical Models for Quantum Dots, 589-605, 2021
92 2021 A simple current collapse measurement technique for GaN high-electron mobility transistors J Joh, JA Del Alamo, J Jimenez
IEEE Electron Device Letters 29 (7), 665-667, 2008
92 2008 X-band GaN FET reliability JL Jimenez, U Chowdhury
2008 IEEE International Reliability Physics Symposium, 429-435, 2008
90 2008 ScAlN/GaN high-electron-mobility transistors with 2.4-A/mm current density and 0.67-S/mm transconductance AJ Green, JK Gillespie, RC Fitch, DE Walker, M Lindquist, A Crespo, ...
IEEE Electron Device Letters 40 (7), 1056-1059, 2019
79 2019 Electrical and thermal performance of AlGaN/GaN HEMTs on diamond substrate for RF applications DC Dumka, TM Chou, JL Jimenez, DM Fanning, D Francis, F Faili, ...
2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 1-4, 2013
76 2013 The quantum dot spectrometer JL Jimenez, LRC Fonseca, DJ Brady, JP Leburton, DE Wohlert, ...
Applied Physics Letters 71 (24), 3558-3560, 1997
63 1997 Analytical HFET A Koudymov, MS Shur, G Simin, K Chu, PC Chao, C Lee, J Jimenez, ...
IEEE Transactions on Electron Devices 55 (3), 712-720, 2008
57 2008 Progress in GaN performances and reliability P Saunier, C Lee, A Balistreri, D Dumka, J Jimenez, HQ Tserng, MY Kao, ...
2007 65th Annual Device Research Conference, 35-36, 2007
49 2007 Temperature assessment of AlGaN/GaN HEMTs: A comparative study by Raman, electrical and IR thermography N Killat, M Kuball, TM Chou, U Chowdhury, J Jimenez
2010 IEEE International Reliability Physics Symposium, 528-531, 2010
47 2010 The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability M Ťapajna, N Killat, U Chowdhury, JL Jimenez, M Kuball
Microelectronics Reliability 52 (1), 29-32, 2012
29 2012 GaN RF Technology for dummies A Moore, J Jimenez
TriQuint Special Edition Published by John Wiley & Sons, Inc 111, 07030-5774, 2015
27 2015 Increased responsivity photodetector A Mahajan, EA Beam III, JL Jiminez, AA Ketterson
US Patent 7,148,463, 2006
22 2006 Qorvo's emerging GaN technologies for mmwave applications Y Cao, V Kumar, S Chen, Y Cui, S Yoon, E Beam, A Xie, J Jimenez, ...
2020 IEEE/MTT-S International Microwave Symposium (IMS), 570-572, 2020
21 2020 Correlation between RF and DC reliability in GaN high electron mobility transistors J Joh, JA Del Alamo, U Chowdhury, JL Jimenez
2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop], 185-194, 2008
20 2008 Resonant tunneling in AlSb‐GaSb‐AlSb and AlSb‐InGaSb‐AlSb double barrier heterostructures JL Jimenez, X Li, WI Wang
Applied physics letters 64 (16), 2127-2129, 1994
20 1994 Average pitch gratings for optical filtering applications AA Ketterson, JL Jimenez, CT Youtsey
US Patent 7,130,124, 2006
16 2006 
Cathy LeeQorvo IncEmail confirmado em qorvo.com
