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Chetan D Parikh
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Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs
S Mahapatra, CD Parikh, VR Rao, CR Viswanathan, J Vasi
IEEE Transactions on Electron Devices 47 (4), 789-796, 2000
722000
A new charge-control model for single-and double-heterojunction bipolar transistors
CD Parikh, FA Lindholm
IEEE transactions on electron devices 39 (6), 1303-1311, 1992
581992
Space-charge region recombination in heterojunction bipolar transistors
CD Parikh, FA Lindholm
IEEE transactions on electron devices 39 (10), 2197-2205, 1992
461992
A comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique
S Mahapatra, CD Parikh, VR Rao, CR Viswanathan, J Vasi
IEEE Transactions on Electron Devices 47 (1), 171-177, 2000
452000
Modeling of the CoolMOS/sup TM/transistor-Part I: Device physics
BJ Daniel, CD Parikh, MB Patil
IEEE Transactions on Electron Devices 49 (5), 916-922, 2002
432002
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
S Mahapatra, CD Parikh, J Vasi, VR Rao, CR Viswanathan
Solid-State Electronics 43 (5), 915-922, 1999
341999
Analysis of breakdown voltage and on resistance of super junction power MOSFET CoolMOS/sup TM/using theory of novel voltage sustaining layer
PN Kondekar, CD Parikh, MB Patil
2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference …, 2002
312002
Modeling of the CoolMOS/sup TM/transistor. II. DC model and parameter extraction
BJ Daniel, CD Parikh, MB Patil
IEEE Transactions on Electron Devices 49 (5), 923-929, 2002
212002
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
S Mahapatra, VR Rao, KNM Rani, CD Parikh, J Vasi, B Cheng, M Khare, ...
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No …, 1999
171999
Performance and hot-carrier reliability of 100 nm channel length jet vapor deposited Si/sub 3/N/sub 4/MNSFETs
S Mahapatra, VR Rao, B Cheng, M Khare, CD Parikh, JCS Woo, JM Vasi
IEEE Transactions on Electron Devices 48 (4), 679-684, 2001
162001
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
S Mahapatra, VR Rao, CD Parikh, J Vasi, B Cheng, JCS Woo
Microelectronic engineering 48 (1-4), 193-196, 1999
141999
A new" multifrequency" charge pumping technique to profile hot-carrier-induced interface-state density in nMOSFET's
S Mahapatra, CD Parikh, J Vasi
IEEE Transactions on Electron Devices 46 (5), 960-967, 1999
141999
High performance operational amplifier with 90db gain in scl 180nm technology
S Padma, S Das, S Sen, CD Parikh
2020 24th International Symposium on VLSI Design and Test (VDAT), 1-5, 2020
132020
Analysis and design of superjunction power MOSFET: CoolMOS/spl trade/for improved on resistance and breakdown voltage using theory of novel voltage sustaining layer
PN Kondekar, MB Patil, CD Parikh
2002 23rd International Conference on Microelectronics. Proceedings (Cat. No …, 2002
122002
Design of low power and high speed comparator with sub-32-nm Double Gate-MOSFET
VR Bhumireddy, KA Shaik, A Amara, S Sen, CD Parikh, D Nagchoudhuri, ...
2013 IEEE International Conference on Circuits and Systems (ICCAS), 1-4, 2013
112013
A compact model for the N-well resistor
CD Parikh, RM Patrikar
Solid-State Electronics 43 (3), 683-685, 1999
111999
Deterministic digital calibration technique for 1.5 bits/stage pipelined and algorithmic ADCs with finite op-amp gain and large capacitance mismatches
C Ramamurthy, CD Parikh, S Sen
Circuits, Systems, and Signal Processing 40 (8), 3684-3702, 2021
92021
A new delay model and geometric programming-based design automation for latched comparators
A Purushothaman, CD Parikh
Circuits, Systems, and Signal Processing 34, 2749-2764, 2015
92015
A 0.7-V rail-to-rail buffer amplifier with double-gate MOSFETs
A Amara, CD Parikh, D Nagchoudhuri
Faible Tension Faible Consommation (FTFC), IEEE, 2011
92011
Modeling power VDMOSFET transistors: Device physics and equivalent circuit model with parameter extraction
R Vaid, N Padha, A Kumar, RS Gupta, CD Parikh
CSIR, 2004
92004
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