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Co-authors
- Mahta MoghaddamUSC, U of Michigan, JPLVerified email at usc.edu
- Prof. Chandan ChakrabortyProfessorVerified email at nitttrkol.ac.in
- Ajoy Kumar RayProfessor of Electronics and Electrical Communications Engineering, IIT KharagpurVerified email at ece.iitkgp.ac.in
- Muthu Rama Krishnan Mookiah, PhDPostdoctoral Researcher, University of Dundee, Scotland, UKVerified email at dundee.ac.uk
- Guanbo ChenUSC, SamsungVerified email at samsung.com
- Uday K KhankhojeIndian Institute of Technology MadrasVerified email at ee.iitm.ac.in
- Jyotirmoy ChatterjeeAssociate Professor of SMST, Indian Institute of Technology, KharagpurVerified email at smst.iitkgp.ernet.in
- Mousumi PalProfessor & Head, Dept. of Oral & Maxillo- Facial Pathology, GNIDSR, WBUHS, KOLKATA.Verified email at jisgroup.org
- Anirudh ChoudharyUniversity of Illinois at Urbana-ChampaignVerified email at illinois.edu
- Mousumi PalHead, Dept. of Oral & Maxillo-facial Pathology, GNIDSR, KolkataVerified email at jisgroup.org
- Mithun Das GuptaUIUC, Epson RnD, GE, Ricoh Innovations, IBM, MicrosoftVerified email at microsoft.com
- Agnelo Rocha da SilvaMETER Group, USC, U of Michigan, UNLVerified email at metergroup.com
- Ruzbeh AkbarMassachusetts Institute of TechnologyVerified email at mit.edu
- Alireza TabatabaeenejadMicrowave Remote Sensing Scientist, The Aerospace CorporationVerified email at aero.org
- Xueyang DuanJet Propulsion LaboratoryVerified email at jpl.nasa.gov