X-ray surface analysis and measurement apparatus W Yun, SJY Lewis, J Kirz US Patent 9,594,036, 2017 | 67 | 2017 |
X-ray interferometric imaging system W Yun, SJY Lewis, J Kirz US Patent 9,719,947, 2017 | 61 | 2017 |
High brightness X-ray absorption spectroscopy system W Yun, SJY Lewis, J Kirz US Patent 9,448,190, 2016 | 54 | 2016 |
Structural, dynamic, and chemical complexities in zinc anode of an operating aqueous Zn‐ion battery G Qian, G Zan, J Li, SJ Lee, Y Wang, Y Zhu, S Gul, DJ Vine, S Lewis, ... Advanced Energy Materials 12 (21), 2200255, 2022 | 51 | 2022 |
X-ray surface analysis and measurement apparatus W Yun, SJY Lewis, J Kirz US Patent 9,823,203, 2017 | 51 | 2017 |
X-ray method for the measurement, characterization, and analysis of periodic structures W Yun, SJY Lewis, J Kirz US Patent 9,874,531, 2018 | 49 | 2018 |
X-ray transmission spectrometer system W Yun, S Seshadri, J Kirz, SJY Lewis US Patent 10,295,485, 2019 | 45 | 2019 |
X-ray interferometric imaging system W Yun, SJY Lewis, J Kirz, AF Lyon US Patent App. 14/527,523, 2015 | 45 | 2015 |
X-ray illuminators with high flux and high flux density W Yun, SJY Lewis, J Kirz US Patent 9,449,781, 2016 | 44 | 2016 |
X-ray sources using linear accumulation W Yun, SJY Lewis, J Kirz, AF Lyon US Patent 9,390,881, 2016 | 40 | 2016 |
X-ray fluorescence system with high flux and high flux density W Yun, SJY Lewis, J Kirz US Patent 9,570,265, 2017 | 39 | 2017 |
X-ray interferometric imaging system W Yun, SJY Lewis, J Kirz, AF Lyon US Patent 10,349,908, 2019 | 37 | 2019 |
Detector for X-rays with high spatial and high spectral resolution W Yun, SJY Lewis, J Kirz, BD Stripe US Patent 10,295,486, 2019 | 37 | 2019 |
X-ray techniques using structured illumination W Yun, SJY Lewis, J Kirz US Patent 10,401,309, 2019 | 35 | 2019 |
Method and apparatus for x-ray microscopy W Yun, SJY Lewis, J Kirz, S Seshadri, AF Lyon, D Vine US Patent 10,352,880, 2019 | 35 | 2019 |
X-ray sources using linear accumulation W Yun, SJY Lewis, J Kirz, AF Lyon US Patent 9,543,109, 2017 | 32 | 2017 |
Diverging X-ray sources using linear accumulation W Yun, SJY Lewis, J Kirz, AF Lyon, DC Reynolds US Patent 10,269,528, 2019 | 30 | 2019 |
X-ray illuminators with high flux and high flux density W Yun, SJY Lewis, J Kirz US Patent App. 15/431,786, 2019 | 30 | 2019 |
X-ray illumination system with multiple target microstructures W Yun, SJY Lewis, J Kirz, DC Reynolds, AF Lyon US Patent 10,297,359, 2019 | 28 | 2019 |
Method of performing X-ray spectroscopy and X-ray absorption spectrometer system W Yun, S Seshadri, SJY Lewis, J Kirz, AF Lyon, BD Stripe US Patent 10,416,099, 2019 | 26 | 2019 |