Dae-Young Jeon
Dae-Young Jeon
KIST Jeonbuk, South Korea
Email confirmado em kist.re.kr - Página inicial
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The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy
NJ Lee, JW Yoo, YJ Choi, CJ Kang, DY Jeon, DC Kim, S Seo, HJ Chung
Applied Physics Letters 95 (22), 222107, 2009
1262009
Oxide double‐layer nanocrossbar for ultrahigh‐density bipolar resistive memory
SH Chang, SB Lee, DY Jeon, SJ Park, GT Kim, SM Yang, SC Chae, ...
Advanced materials 23 (35), 4063-4067, 2011
1242011
The structural and electrical evolution of graphene by oxygen plasma-induced disorder
DC Kim, DY Jeon, HJ Chung, YS Woo, JK Shin, S Seo
Nanotechnology 20 (37), 375703, 2009
1142009
Revisited parameter extraction methodology for electrical characterization of junctionless transistors
DY Jeon, SJ Park, M Mouis, M Berthomé, S Barraud, GT Kim, G Ghibaudo
Solid-State Electronics 90, 86-93, 2013
922013
Low-temperature electrical characterization of junctionless transistors
DY Jeon, SJ Park, M Mouis, S Barraud, GT Kim, G Ghibaudo
Solid-State Electronics 80, 135-141, 2013
742013
Radio-frequency electrical characteristics of single layer graphene
DY Jeon, KJ Lee, M Kim, DC Kim, HJ Chung, YS Woo, S Seo
Japanese Journal of Applied Physics 48 (9R), 091601, 2009
462009
Stack structure comprising epitaxial graphene, method of forming the stack structure, and electronic device comprising the stack structure
Y Woo, SA Seo, D Kim, H Chung, DY Jeon
US Patent 8,159,037, 2012
452012
High-resolution field effect sensing of ferroelectric charges
H Ko, K Ryu, H Park, C Park, D Jeon, YK Kim, J Jung, DK Min, Y Kim, ...
Nano letters 11 (4), 1428-1433, 2011
412011
Low-frequency noise behavior of junctionless transistors compared to inversion-mode transistors
DY Jeon, SJ Park, M Mouis, S Barraud, GT Kim, G Ghibaudo
Solid-state electronics 81, 101-104, 2013
372013
Effects of channel width variation on electrical characteristics of tri-gate Junctionless transistors
DY Jeon, SJ Park, M Mouis, S Barraud, GT Kim, G Ghibaudo
Solid-state electronics 81, 58-62, 2013
302013
Scaling and graphical transport-map analysis of ambipolar Schottky-barrier thin-film transistors based on a parallel array of Si nanowires
DY Jeon, S Pregl, SJ Park, L Baraban, G Cuniberti, T Mikolajick, ...
Nano letters 15 (7), 4578-4584, 2015
282015
Back biasing effects in tri-gate junctionless transistors
SJ Park, DY Jeon, L Montès, S Barraud, GT Kim, G Ghibaudo
Solid-state electronics 87, 74-79, 2013
282013
Electrical properties of the ZnO nanowire transistor and its analysis with equivalent circuit model
CY Yim, DY Jeon, KH Kim, GT Kim, YS Woo, S Roth, JS Lee, S Kim
Journal of the Korean Physical Society 48 (6), 1565-1569, 2006
222006
Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors
SJ Park, DY Jeon, SE Ahn, S Jeon, L Montès, GT Kim, G Ghibaudo
Thin Solid Films 548, 560-565, 2013
192013
Impact of series resistance on the operation of junctionless transistors
DY Jeon, SJ Park, M Mouis, S Barraud, GT Kim, G Ghibaudo
Solid-State Electronics 129, 103-107, 2017
182017
Less mobility degradation induced by transverse electric-field in junctionless transistors
SJ Park, DY Jeon, L Montes, M Mouis, S Barraud, GT Kim, G Ghibaudo
Applied Physics Letters 105 (21), 213504, 2014
172014
Static and low frequency noise characterization of N-type random network of carbon nanotubes thin film transistors
MK Joo, M Mouis, DY Jeon, GT Kim, UJ Kim, G Ghibaudo
Journal of Applied Physics 114 (15), 154503, 2013
172013
Electrical characterization and revisited parameter extraction methodology in junctionless transistors
DY Jeon, SJ Park, M Mouis, M Berthomé, S Barraud, GT Kim, G Ghibaudo
Proc. EuroSOI, 109-110, 2012
162012
Flat-band voltage and low-field mobility analysis of junctionless transistors under low-temperature
MK Joo, M Mouis, DY Jeon, S Barraud, SJ Park, GT Kim, G Ghibaudo
Semiconductor Science and Technology 29 (4), 045024, 2014
152014
Controlled surface adsorption of fd filamentous phage by tuning of the pH and the functionalization of the surface
DY Jeon, KH Hwang, SJ Park, YJ Kim, MK Joo, SE Ahn, GT Kim, CH Nam
Journal of Applied physics 109 (6), 064701, 2011
152011
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