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Frederic MARTYUniversité Gustave Eiffel, ESIEE Paris, CNRS, ESYCOM Lab.Verified email at esiee.fr
Philippe BASSETProfessor - ESYCOM lab, Université Gustave Eiffel / ESIEE Paris, CNRSVerified email at esiee.fr
Diaa KhalilAin Shams University - Si-Ware SystemsVerified email at eng.asu.edu.eg
Yasser M. SabryAin Shams University- Si-Ware SystemsVerified email at eng.asu.edu.eg
Yamin Leprince-WangProfesseur de Physique, Université Gustave EiffelVerified email at u-pem.fr
Yoshio MITAThe University of TokyoVerified email at ee.t.u-tokyo.ac.jp
Alain BOSSEBOEUFResearcher, C2N/CNRS-University Paris SaclayVerified email at c2n.upsaclay.fr
WM zhuSingapore Institute of Manufacturing TechnologyVerified email at simtech.a-star.edu.sg
Wee SerNanyang Technological UniversityVerified email at ntu.edu.sg
Dan AngelescuFluidionVerified email at fluidion.com
Din Ping TsaiCity University of Hong KongVerified email at cityu.edu.hk
Eric Peng Huat YAPLee Kong Chian School of Medicine, Nanyang Technological University - Imperial College LondonVerified email at ntu.edu.sg
JH TengSingaporeVerified email at imre.a-star.edu.sg
Lip Ket ChinCity University of Hong KongVerified email at cityu.edu.hk
Francesco CottoneAssociate Professor at Department of Physics and Geology, University of Perugia (Italy)Verified email at esiee.fr
Elyes NEFZAOUIAssociate Professor at ESYCOM Lab, ESIEE Paris, Univ Gustave EiffelVerified email at esiee.fr
M. CapochichiUniversité Paris-EstVerified email at u-pem.fr
Mazen ErfanUniversité Gustave Eiffel, ESIEE Paris, CNRS, ESYCOM LabVerified email at esiee.fr
Noha GaberZewail City of Science and Technology, ESIEE-ParisVerified email at zewailcity.edu.eg
Eric LebrasseurThe University of TokyoVerified email at if.t.u-tokyo.ac.jp
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