Cheng Xue
Cheng Xue
Verified email at qti.qualcomm.com
Title
Cited by
Cited by
Year
DREAMS: DFM rule EvAluation using manufactured silicon
RD Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 99-106, 2013
172013
DFM evaluation using IC diagnosis data
RDS Blanton, F Wang, C Xue, PK Nag, Y Xue, X Li
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
72016
Predicting IC defect level using diagnosis
C Xue, RDS Blanton
2014 IEEE 23rd Asian Test Symposium, 113-118, 2014
62014
Test-set reordering for improving diagnosability
C Xue, RD Blanton
2017 IEEE 35th VLSI Test Symposium (VTS), 1-6, 2017
52017
A one-pass test-selection method for maximizing test coverage
C Xue, RD Shawn
2015 33rd IEEE International Conference on Computer Design (ICCD), 621-628, 2015
52015
Optimizing IC Testing for Diagnosability, Effectiveness and Efficiency
C Xue
Carnegie Mellon University, 2016
2016
Delay Fault Model Evaluation Using Tester Response Data
C Xue, RDS Blanton
ISTFA 2012, 532-537, 2012
2012
The system can't perform the operation now. Try again later.
Articles 1–7