Predictive error detection by on-line aging monitoring JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semião, IC Teixeira, ... 2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010 | 45 | 2010 |
Adaptive error-prediction flip-flop for performance failure prediction with aging sensors CV Martins, J Semião, JC Vazquez, V Champac, M Santos, IC Teixeira, ... 29th VLSI Test Symposium, 203-208, 2011 | 43 | 2011 |
Signal integrity enhancement in digital circuits JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ... IEEE Design & Test of Computers 25 (5), 452-461, 2008 | 29 | 2008 |
Impact of power supply voltage variations on FPGA-based digital systems performance J Freijedo, L Costas, J Semião, JJ Rodríguez-Andina, MJ Moure, ... Journal of Low Power Electronics 6 (2), 339-349, 2010 | 28 | 2010 |
Aging-aware power or frequency tuning with predictive fault detection J Pachito, CV Martins, B Jacinto, J Semiao, JC Vazquez, V Champac, ... IEEE Design & Test of Computers 29 (5), 27-36, 2012 | 24 | 2012 |
Time management for low-power design of digital systems J Semião, JF Freijedo, JJ Rodriguez-Andina, F Vargas, MB Santos, ... Journal of Low Power Electronics 4 (3), 410-419, 2008 | 24 | 2008 |
Design and validation of configurable online aging sensors in nanometer-scale FPGAs MD Valdes-Pena, JF Freijedo, MJM Rodríguez, JJ Rodriguez-Andina, ... IEEE transactions on nanotechnology 12 (4), 508-517, 2013 | 23 | 2013 |
A distributed load scheduling mechanism for micro grids J Monteiro, J Eduardo, PJS Cardoso, J Semião 2014 IEEE International Conference on Smart Grid Communications …, 2014 | 15 | 2014 |
Performance sensor for tolerance and predictive detection of delay-faults J Semião, D Saraiva, C Leong, A Romão, MB Santos, IC Teixeira, ... 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014 | 15 | 2014 |
Adaptive error-prediction aging sensor for on-line monitoring of performance errors C Martins, J Pachito, J Semião, IC Teixeira, JP Teixeira Proceedings of the 26th Conference on Design of Circuits and Integrated …, 2011 | 15 | 2011 |
Aging monitoring with local sensors in FPGA-based designs C Leong, J Semião, IC Teixeira, MB Santos, JP Teixeira, M Valdes, ... 2013 23rd International Conference on Field programmable Logic and …, 2013 | 14 | 2013 |
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications RS Oliveira, J Semiao, IC Teixeira, MB Santos, JP Teixeira 2011 12th Latin American Test Workshop (LATW), 1-6, 2011 | 14 | 2011 |
Delay-fault tolerance to power supply voltage disturbances analysis in nanometer technologies J Semião, J Freijedo, J Rodriguez-Andina, F Vargas, M Santos, I Teixeira, ... 2009 15th IEEE International On-Line Testing Symposium, 223-228, 2009 | 13 | 2009 |
Digital circuit signal integrity enhancement by monitoring power grid activity J Semião, M Rodriguez-Irago, L Piccoli, F Vargas, MB Santos, IC Teixeira, ... Proc. IEEE Latin American Test Workshop (LATW), 2007 | 13 | 2007 |
Performance failure prediction using built-in delay sensors in FPGAs V Bexiga, C Leong, J Semião, IC Teixeira, JP Teixeira, M Valdes, ... 2011 21st International Conference on Field Programmable Logic and …, 2011 | 12 | 2011 |
Improving the tolerance of pipeline based circuits to power supply or temperature variations J Semião, JJ Rodríguez-Andina, F Vargas, MB Santos, IC Teixeira, ... 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007 | 12 | 2007 |
Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits JF Freijedo, J Semião, JJ Rodriguez-Andina, F Vargas, IC Teixeira, ... Journal of Electronic Testing 28 (4), 421-434, 2012 | 11 | 2012 |
Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits J Semião, J Freijedo, JJ Rodríguez-Andina, F Vargas, M Santos, I Teixeira, ... 2008 14th IEEE International On-Line Testing Symposium, 227-232, 2008 | 11 | 2008 |
Portable device for touch, taste and smell sensations in augmented reality experiences JDP Sardo, J Semião, JM Monteiro, JAR Pereira, MAG de Freitas, ... International Congress on Engineering and Sustainability in the XXI Century …, 2017 | 10 | 2017 |
Measuring clock-signal modulation efficiency for systems-on-chip in electromagnetic interference environment J Semião, J Freijedo, M Moraes, M Mallmann, C Antunes, J Benfica, ... 2009 10th Latin American Test Workshop, 1-6, 2009 | 10 | 2009 |