Jorge Semião
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Predictive error detection by on-line aging monitoring
JC Vazquez, V Champac, AM Ziesemer, R Reis, J Semião, IC Teixeira, ...
2010 IEEE 16th International On-Line Testing Symposium, 9-14, 2010
Adaptive error-prediction flip-flop for performance failure prediction with aging sensors
CV Martins, J Semião, JC Vazquez, V Champac, M Santos, IC Teixeira, ...
29th VLSI Test Symposium, 203-208, 2011
Signal integrity enhancement in digital circuits
JFLC Semio, MJR Irago, JJ Rodriguez-Andina, LB Piccoli, FL Vargas, ...
IEEE Design & Test of Computers 25 (5), 452-461, 2008
Impact of power supply voltage variations on FPGA-based digital systems performance
J Freijedo, L Costas, J Semião, JJ Rodríguez-Andina, MJ Moure, ...
Journal of Low Power Electronics 6 (2), 339-349, 2010
Aging-aware power or frequency tuning with predictive fault detection
J Pachito, CV Martins, B Jacinto, J Semiao, JC Vazquez, V Champac, ...
IEEE Design & Test of Computers 29 (5), 27-36, 2012
Time management for low-power design of digital systems
J Semião, JF Freijedo, JJ Rodriguez-Andina, F Vargas, MB Santos, ...
Journal of Low Power Electronics 4 (3), 410-419, 2008
Design and validation of configurable online aging sensors in nanometer-scale FPGAs
MD Valdes-Pena, JF Freijedo, MJM Rodríguez, JJ Rodriguez-Andina, ...
IEEE transactions on nanotechnology 12 (4), 508-517, 2013
A distributed load scheduling mechanism for micro grids
J Monteiro, J Eduardo, PJS Cardoso, J Semião
2014 IEEE International Conference on Smart Grid Communications …, 2014
Performance sensor for tolerance and predictive detection of delay-faults
J Semião, D Saraiva, C Leong, A Romão, MB Santos, IC Teixeira, ...
2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2014
Adaptive error-prediction aging sensor for on-line monitoring of performance errors
C Martins, J Pachito, J Semião, IC Teixeira, JP Teixeira
Proceedings of the 26th Conference on Design of Circuits and Integrated …, 2011
Aging monitoring with local sensors in FPGA-based designs
C Leong, J Semião, IC Teixeira, MB Santos, JP Teixeira, M Valdes, ...
2013 23rd International Conference on Field programmable Logic and …, 2013
On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications
RS Oliveira, J Semiao, IC Teixeira, MB Santos, JP Teixeira
2011 12th Latin American Test Workshop (LATW), 1-6, 2011
Delay-fault tolerance to power supply voltage disturbances analysis in nanometer technologies
J Semião, J Freijedo, J Rodriguez-Andina, F Vargas, M Santos, I Teixeira, ...
2009 15th IEEE International On-Line Testing Symposium, 223-228, 2009
Digital circuit signal integrity enhancement by monitoring power grid activity
J Semião, M Rodriguez-Irago, L Piccoli, F Vargas, MB Santos, IC Teixeira, ...
Proc. IEEE Latin American Test Workshop (LATW), 2007
Performance failure prediction using built-in delay sensors in FPGAs
V Bexiga, C Leong, J Semião, IC Teixeira, JP Teixeira, M Valdes, ...
2011 21st International Conference on Field Programmable Logic and …, 2011
Improving the tolerance of pipeline based circuits to power supply or temperature variations
J Semião, JJ Rodríguez-Andina, F Vargas, MB Santos, IC Teixeira, ...
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
Modeling the effect of process, power-supply voltage and temperature variations on the timing response of nanometer digital circuits
JF Freijedo, J Semião, JJ Rodriguez-Andina, F Vargas, IC Teixeira, ...
Journal of Electronic Testing 28 (4), 421-434, 2012
Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
J Semião, J Freijedo, JJ Rodríguez-Andina, F Vargas, M Santos, I Teixeira, ...
2008 14th IEEE International On-Line Testing Symposium, 227-232, 2008
Portable device for touch, taste and smell sensations in augmented reality experiences
JDP Sardo, J Semião, JM Monteiro, JAR Pereira, MAG de Freitas, ...
International Congress on Engineering and Sustainability in the XXI Century …, 2017
Measuring clock-signal modulation efficiency for systems-on-chip in electromagnetic interference environment
J Semião, J Freijedo, M Moraes, M Mallmann, C Antunes, J Benfica, ...
2009 10th Latin American Test Workshop, 1-6, 2009
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