Babis Dimitriadis
Babis Dimitriadis
Department of Physics Aristotle University of Thessaloniki, 54124, Greece
Email confirmado em physics.auth.gr - Página inicial
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Electronic properties of semiconducting FeSi2 films
CA Dimitriadis, JH Werner, S Logothetidis, M Stutzmann, J Weber, ...
Journal of applied physics 68 (4), 1726-1734, 1990
2971990
Solid-State Electron
KP Lee, J Brini, A Chovet, CA Dimitriadis
Solid-State Electron, 2002
142*2002
A SEM-EBIC minority-carrier diffusion-length measurement technique
DE Ioannou, CA Dimitriadis
IEEE Transactions on Electron Devices 29 (3), 445-450, 1982
1351982
Performance of thin-film transistors on polysilicon films grown by low-pressure chemical vapor deposition at various pressures
CA Dimitriadis, PA Coxon, L Dozsa, L Papadimitriou, N Economou
IEEE transactions on electron devices 39 (3), 598-606, 1992
1301992
On-current modeling of large-grain polycrystalline silicon thin-film transistors
FV Farmakis, J Brini, G Kamarinos, CT Angelis, CA Dimitriadis, ...
IEEE Transactions on Electron Devices 48 (4), 701-706, 2001
1062001
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors
CT Angelis, CA Dimitriadis, M Miyasaka, FV Farmakis, G Kamarinos, ...
Journal of applied physics 86 (8), 4600-4606, 1999
1061999
Semi-analytical modeling of short-channel effects in Si and Ge symmetrical double-gate MOSFETs
A Tsormpatzoglou, CA Dimitriadis, R Clerc, Q Rafhay, G Pananakakis, ...
IEEE Transactions on Electron devices 54 (8), 1943-1952, 2007
1022007
Effect of pressure on the growth of crystallites of low‐pressure chemical‐vapor‐deposited polycrystalline silicon films and the effective electron mobility under high normal …
CA Dimitriadis, J Stoemenos, PA Coxon, S Friligkos, J Antonopoulos, ...
Journal of applied physics 73 (12), 8402-8411, 1993
1011993
Threshold voltage model for short-channel undoped symmetrical double-gate MOSFETs
A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo
IEEE transactions on Electron Devices 55 (9), 2512-2516, 2008
992008
Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors
FV Farmakis, J Brini, G Kamarinos, CA Dimitriadis
IEEE Electron Device Letters 22 (2), 74-76, 2001
882001
Advances in the electrical assessment of semiconductors using the scanning electron microscope
SM Davidson, CA Dimitriadis
Journal of microscopy 118 (3), 275-290, 1980
851980
Determination of bulk states and interface states distributions in polycrystalline silicon thin‐film transistors
CA Dimitriadis, DH Tassis, NA Economou, AJ Lowe
Journal of applied physics 74 (4), 2919-2924, 1993
721993
Schottky barrier contacts of titanium nitride on n‐type silicon
CA Dimitriadis, S Logothetidis, I Alexandrou
Applied physics letters 66 (4), 502-504, 1995
691995
Semianalytical modeling of short-channel effects in lightly doped silicon trigate MOSFETs
A Tsormpatzoglou, CA Dimitriadis, R Clerc, G Pananakakis, G Ghibaudo
IEEE transactions on electron devices 55 (10), 2623-2631, 2008
652008
Growth mechanism and morphology of semiconducting FeSi2 films
CA Dimitriadis, JH Werner
Journal of applied physics 68 (1), 93-96, 1990
651990
Study of leakage current in -channel and -channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements
CT Angelis, CA Dimitriadis, I Samaras, J Brini, G Kamarinos, ...
Journal of applied physics 82 (8), 4095-4101, 1997
621997
On the threshold voltage and channel conductance of polycrystalline silicon thin‐film transistors
CA Dimitriadis, DH Tassis
Journal of applied physics 79 (8), 4431-4437, 1996
601996
A compact drain current model of short-channel cylindrical gate-all-around MOSFETs
A Tsormpatzoglou, DH Tassis, CA Dimitriadis, G Ghibaudo, ...
Semiconductor science and technology 24 (7), 075017, 2009
572009
Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors
CA Dimitriadis, M Kimura, M Miyasaka, S Inoue, FV Farmakis, J Brini, ...
Solid-State Electronics 44 (11), 2045-2051, 2000
542000
Simple parameter extraction method for non-ideal Schottky barrier diodes
JI Lee, J Brini, CA Dimitriadis
Electronics Letters 34 (12), 1268-1269, 1998
521998
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Artigos 1–20