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Diego Mateo
Diego Mateo
Electronic Engineering Department, UPC
Email confirmado em upc.edu
Título
Citado por
Citado por
Ano
De flora valentina
G Mateo, FMM Solís
Flora Montiberica, 38-40, 1995
85*1995
Electrothermal design procedure to observe RF circuit power and linearity characteristics with a homodyne differential temperature sensor
M Onabajo, J Altet, E Aldrete-Vidrio, D Mateo, J Silva-Martinez
IEEE Transactions on Circuits and Systems I: Regular Papers 58 (3), 458-469, 2010
382010
Diseño de circuitos y sistemas integrados
JAR Sola
Univ. Politèc. de Catalunya, 2003
342003
Diseño de circuitos y sistemas integrados
JAR Sola
Univ. Politèc. de Catalunya, 2003
342003
Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements
E Aldrete-Vidrio, D Mateo, J Altet, MA Salhi, S Grauby, S Dilhaire, ...
Measurement Science and Technology 21 (7), 075104, 2010
332010
A built-in quiescent current monitor for CMOS VLSI circuits
A Rubio, E Janssens, H Casier, J Figueras, D Mateo, P De Pauw, ...
Proceedings the European Design and Test Conference. ED&TC 1995, 581-585, 1995
321995
Differential Temperature Sensors Fully Compatible With a 0.35-m CMOS Process
E Aldrete-Vidrio, D Mateo, J Altet
IEEE Transactions on Components and Packaging Technologies 30 (4), 618-626, 2007
292007
Modelling and evaluation of substrate noise induced by interconnects
F Martorell, D Mateo, X Aragonès
IEE Proceedings-Computers and Digital Techniques 150 (5), 338-345, 2003
282003
Built-in dynamic current sensor circuit for digital VLSI CMOS testing
J Segura, M Roca, D Mateo, A Rubio
electronics Letters 30 (20), 1668-1669, 1994
261994
Design and implementation of a 5/spl times/5 trits multiplier in a quasi-adiabatic ternary CMOS logic
D Mateo, A Rubio
IEEE Journal of Solid-State Circuits 33 (7), 1111-1116, 1998
251998
An approach to dynamic power consumption current testing of CMOS ICs
JA Segura, M Roca, D Mateo, A Rubio
Proceedings 13th IEEE VLSI Test Symposium, 95-100, 1995
251995
A versatile CMOS transistor array IC for the statistical characterization of time-zero variability, RTN, BTI, and HCI
J Diaz-Fortuny, J Martin-Martinez, R Rodriguez, R Castro-Lopez, E Roca, ...
IEEE Journal of Solid-State Circuits 54 (2), 476-488, 2018
222018
A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits
J Altet, E Aldrete-Vidrio, D Mateo, X Perpiñà, X Jordà, M Vellvehi, J Millán, ...
Measurement Science and Technology 19 (11), 115704, 2008
202008
Analytical and experimental verification of substrate noise spectrum for mixed-signal ICs
MA Mendez, D Mateo, A Rubio, JL González
IEEE Transactions on Circuits and Systems I: Regular Papers 53 (8), 1803-1815, 2006
202006
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling
MA Méndez, D Mateo, X Aragonès, JL González
Proceedings of the 31st European Solid-State Circuits Conference, 2005 …, 2005
202005
Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors
J Altet, D Gomez, X Perpinyà, D Mateo, JL González, M Vellvehi, X Jordà
Sensors and Actuators A: Physical 192, 49-57, 2013
192013
MOSFET degradation dependence on input signal power in a RF power amplifier
A Crespo-Yepes, E Barajas, J Martin-Martinez, D Mateo, X Aragones, ...
Microelectronic Engineering 178, 289-292, 2017
172017
DC temperature measurements for power gain monitoring in RF power amplifiers
J Altet, D Mateo, D Gómez, X Perpiñà, M Vellvehi, X Jordà
2012 IEEE International Test Conference, 1-8, 2012
172012
Electro-thermal coupling analysis methodology for RF circuits
D Gómez, C Dufis, J Altet, D Mateo, JL González
Microelectronics Journal 43 (9), 633-641, 2012
172012
Electro-thermal coupling analysis methodology for RF circuits
D Gómez, C Dufis, J Altet, D Mateo, JL González
Microelectronics Journal 43 (9), 633-641, 2012
172012
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Artigos 1–20