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Ondrej Krivanek
Ondrej Krivanek
Nion Co., Arizona State U.
Verified email at nion.com - Homepage
Title
Cited by
Cited by
Year
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
OL Krivanek, MF Chisholm, V Nicolosi, TJ Pennycook, GJ Corbin, ...
Nature 464 (7288), 571-574, 2010
14282010
Sub-ångstrom resolution using aberration corrected electron optics
PE Batson, N Dellby, OL Krivanek
Nature 418 (6898), 617-620, 2002
11622002
Towards sub-Å electron beams
OL Krivanek, N Dellby, AR Lupini
Ultramicroscopy 78 (1-4), 1-11, 1999
7861999
Surface roughness at the Si(100)- interface
SM Goodnick, DK Ferry, CW Wilmsen, Z Liliental, D Fathy, OL Krivanek
Physical Review B 32 (12), 8171, 1985
7521985
Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy
DA Muller, LF Kourkoutis, M Murfitt, JH Song, HY Hwang, J Silcox, ...
Science 319 (5866), 1073-1076, 2008
7412008
Vibrational spectroscopy in the electron microscope
OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ...
Nature 514 (7521), 209-212, 2014
7332014
Direct sub-angstrom imaging of a crystal lattice
PD Nellist, MF Chisholm, N Dellby, OL Krivanek, MF Murfitt, ZS Szilagyi, ...
Science 305 (5691), 1741-1741, 2004
6772004
EELS atlas: a reference collection of electron energy loss spectra covering all stable elements
CC Ahn, OL Krivanek, RP Burgner, MM Disko, PR Swann
(No Title), 1983
4771983
Spectroscopic imaging of single atoms within a bulk solid
M Varela, SD Findlay, AR Lupini, HM Christen, AY Borisevich, N Dellby, ...
Physical Review Letters 92 (9), 095502, 2004
3952004
An electron microscope for the aberration-corrected era
OL Krivanek, GJ Corbin, N Dellby, BF Elston, RJ Keyse, MF Murfitt, ...
Ultramicroscopy 108 (3), 179-195, 2008
3752008
ELNES of 3d transition-metal oxides: II. Variations with oxidation state and crystal structure
JH Paterson, OL Krivanek
Ultramicroscopy 32 (4), 319-325, 1990
2671990
Parallel detection electron spectrometer using quadrupole lenses
OL Krivanek, CC Ahn, RB Keeney
Ultramicroscopy 22 (1-4), 103-115, 1987
2531987
Towards sub-0.5 Å electron beams
OL Krivanek, PD Nellist, N Dellby, MF Murfitt, Z Szilagyi
Ultramicroscopy 96 (3-4), 229-237, 2003
2362003
Gentle STEM: ADF imaging and EELS at low primary energies
OL Krivanek, N Dellby, MF Murfitt, MF Chisholm, TJ Pennycook, ...
Ultramicroscopy 110 (8), 935-945, 2010
2292010
Site-specific valence determination by electron energy-loss spectroscopy
J Taftø, OL Krivanek
Physical Review Letters 48 (8), 560, 1982
2291982
Applications of slow-scan CCD cameras in transmission electron microscopy
OL Krivanek, PE Mooney
Ultramicroscopy 49 (1-4), 95-108, 1993
2101993
High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy
OL Krivanek, JP Ursin, NJ Bacon, GJ Corbin, N Dellby, P Hrncirik, ...
Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009
1992009
Lattice imaging of a grain boundary in crystalline germanium
OL Krivanek, S Isoda, K Kobayashi
Philosophical Magazine 36 (4), 931-940, 1977
1901977
Design and first applications of a post-column imaging filter
OL Krivanek, AJ Gubbens, N Dellby, CE Meyer
Microscopy Microanalysis Microstructures 3 (2-3), 187-199, 1992
1831992
Developments in EELS instrumentation for spectroscopy and imaging
OL Krivanek, AJ Gubbens, N Dellby
Microscopy Microanalysis Microstructures 2 (2-3), 315-332, 1991
1671991
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