Tobias Beetz
Tobias Beetz
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High-resolution ab initio three-dimensional x-ray diffraction microscopy
HN Chapman, A Barty, S Marchesini, A Noy, SP Hau-Riege, C Cui, ...
JOSA A 23 (5), 1179-1200, 2006
Biological imaging by soft x-ray diffraction microscopy
D Shapiro, P Thibault, T Beetz, V Elser, M Howells, C Jacobsen, J Kirz, ...
Proceedings of the National Academy of Sciences 102 (43), 15343-15346, 2005
An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy
MR Howells, T Beetz, HN Chapman, C Cui, JM Holton, CJ Jacobsen, ...
Journal of electron spectroscopy and related phenomena 170 (1-3), 4-12, 2009
Optical spectroscopy of individual single-walled carbon nanotubes of defined chiral structure
MY Sfeir, T Beetz, F Wang, L Huang, XMH Huang, M Huang, J Hone, ...
Science 312 (5773), 554-556, 2006
Ir-catalyzed functionalization of 2-substituted indoles at the 7-position: Nitrogen-directed aromatic borylation
S Paul, GA Chotana, D Holmes, RC Reichle, RE Maleczka, MR Smith
Journal of the American Chemical Society 128 (49), 15552-15553, 2006
Transferring self-assembled, nanoscale cables into electrical devices
S Xiao, J Tang, T Beetz, X Guo, N Tremblay, T Siegrist, Y Zhu, ...
Journal of the American Chemical Society 128 (33), 10700-10701, 2006
Polaron melting and ordering as key mechanisms for colossal resistance effects in manganites
C Jooss, L Wu, T Beetz, RF Klie, M Beleggia, MA Schofield, S Schramm, ...
Proceedings of the National Academy of Sciences 104 (34), 13597-13602, 2007
Quasi-continuous growth of ultralong carbon nanotube arrays
BH Hong, JY Lee, T Beetz, Y Zhu, P Kim, KS Kim
Journal of the American Chemical Society 127 (44), 15336-15337, 2005
Soft X-ray radiation-damage studies in PMMA using a cryo-STXM
T Beetz, C Jacobsen
Journal of synchrotron radiation 10 (3), 280-283, 2003
Electric pulse induced resistance change effect in manganites due to polaron localization at the metal-oxide interfacial region
C Jooss, J Hoffmann, J Fladerer, M Ehrhardt, T Beetz, L Wu, Y Zhu
Physical Review B 77 (13), 132409, 2008
Apparatus for x-ray diffraction microscopy and tomography of cryo specimens
T Beetz, MR Howells, C Jacobsen, CC Kao, J Kirz, E Lima, TO Mentes, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005
Radiation sensitivity of natural organic matter: Clay mineral association effects in the Callovo-Oxfordian argillite
T Schäfer, P Michel, F Claret, T Beetz, S Wirick, C Jacobsen
Journal of Electron Spectroscopy and Related Phenomena 170 (1-3), 49-56, 2009
Crystalline graphite from an organometallic solution-phase reaction
EC Walter, T Beetz, MY Sfeir, LE Brus, ML Steigerwald
Journal of the American Chemical Society 128 (49), 15590-15591, 2006
Instrumentation advances and detector development with the Stony Brook scanning transmission X-ray microscope
M Feser, T Beetz, M Carlucci-Dayton, C Jacobsen
AIP Conference Proceedings 507 (1), 367-372, 2000
An in-vacuum x-ray diffraction microscope for use in the 0.7–2.9 keV range
DJ Vine, GJ Williams, JN Clark, CT Putkunz, MA Pfeifer, D Legnini, ...
Review of Scientific Instruments 83 (3), 033703, 2012
Spectromicroscopy of biological and environmental systems at Stony Brook: instrumentation and analysis
C Jacobsen, T Beetz, M Feser, A Osanna, A Stein, S Wirick
Surface Review and Letters 9 (01), 185-191, 2002
Scanning transmission soft x-ray microscopy at beamline X-1A at the NSLS: advances in instrumentation and selected applications
M Feser, T Beetz, CJ Jacobsen, J Kirz, S Wirick, A Stein, T Schäfer
Soft X-Ray and EUV Imaging Systems II 4506, 146-153, 2001
Introduction to semiconductor processing: Fabrication and characterization of p-n junction silicon solar cells
RP Smith, AAC Hwang, T Beetz, E Helgren
American Journal of Physics 86 (10), 740-746, 2018
Soft x-ray diffraction tomography: simulations and first experimental results
T Beetz, C Jacobsen, A Stein
Journal de Physique IV (Proceedings) 104, 31-34, 2003
Soft x‐ray microscopy at the NSLS
T Beetz, M Feser, H Fleckenstein, B Hornberger, C Jacobsen, J Kirz, ...
Taylor & Francis Group 16 (3), 11-15, 2003
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