Cited by
Cited by
Combined spectral and histogram analysis for fast ADC testing
AC Serra, MF da Silva, PM Ramos, RC Martins, L Michaeli, J Saliga
IEEE Transactions on Instrumentation and Measurement 54 (4), 1617-1623, 2005
DNL ADC testing by the exponential shaped voltage
JS Roland Holcer, Linus Michaeli
IEEE transactions on instrumentation and measurement 52, 946-949, 2003
DNL ADC testing by the exponential shaped voltage
R Holcer, L Michaeli
IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement …, 2001
Unified ADC nonlinearity error model for SAR ADC
L Michaeli, P Michalko, J Šaliga
Measurement 41 (2), 198-204, 2008
Volterra filtering for integrating ADC error correction, based on an a priori error model
P Mikulik, J Saliga
IEEE Transactions on Instrumentation and Measurement 51 (4), 870-875, 2002
A comparison of least squares and maximum likelihood methods using sine fitting in ADC testing
J Šaliga, I Kollár, L Michaeli, J Buša, J Lipták, T Virosztek
Measurement 46 (10), 4362-4368, 2013
Identification of ADC error model by testing of the chosen code bins
D Grimaldi, L Michaeli, P Michalko
Proceedings of 12th IMEKO TC4 International Symposium, 132-137, 2002
Software for metrological characterisation of PC sound cards
J Šaliga, L Michaeli
Computer Standards & Interfaces 25 (1), 45-55, 2003
Full information from measured ADC test data using maximum likelihood estimation
L Balogh, I Kollár, L Michaeli, J Šaliga, J Lipták
Measurement 45 (2), 164-169, 2012
Hardware infrastructure of remote laboratory for experimental testing of FPGA based complex reconfigurable systems
M Drutarovský, J Šaliga, I Hroncova
Acta Electrotechnica et Informatica 9 (1), 44-50, 2009
Fast ADC testing by repetitive histogram analysis
AC Serra, F Alegria, L Michaeli, P Michalko, J Saliga
2006 IEEE Instrumentation and Measurement Technology Conference Proceedings …, 2006
Remote laboratory for FPGA based reconfigurable systems testing
M Drutarovský, J Šaliga, L Michaeli, I Hroncová
XIX IMEKO World Congress Fundamental and Applied Metrology, 54-58, 2009
Identification of unified ADC error model by triangular testing signal
L Michaeli, P Michalko, J Saliga
10th Workshop on ADC modelling and testing, 605-610, 2005
Hardware and software platform for ADCWAN remote laboratory
M Corrado, L De Vito, H Ramos, J Saliga
Measurement 45 (4), 795-807, 2012
Processing of bidirectional exponential stimulus in ADC testing
J Šaliga, L Michaeli, M Sakmár, J Buša
Measurement 43 (8), 1061-1068, 2010
Fast gesting of ADC using unified error model
L Michaeli, P Michalko, J Saliga
The 17th IMEKO world congress, 534-537, 2003
Some errors of analogue signal sources for ADC exponential stimulus histogram test
L Michaeli, M Sakmár, J Šaliga
Proc. of 12th TC-4 International Workshop, 18-22, 2003
Noise sensitivity of the exponential histogram ADC test
J Šaliga, L Michaeli, R Holcer
Measurement 39 (3), 238-244, 2006
Fast ADC testing by spectral and histogram analysis
AC Serra, MF Da Silva, P Ramos, L Michaeli, J Saliga
Proceedings of the 21st IEEE Instrumentation and Measurement Technology …, 2004
Using an interpolation method for noise shaping in A/D converters
P Daponte, R Holcer, L Horniak, L Michaeli, S Rapuano
Proc. of 4th IEE ADDA–7th IMEKO TC-4 Workshop on ADC Modelling and Testing …, 2002
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