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Robert Jan van Wijk
Robert Jan van Wijk
Rijksuniversiteit Utrecht, Akzo Nobel, ASML
Verified email at asml.com
Title
Cited by
Cited by
Year
Lithographic apparatus, device manufacturing method, and device manufactured thereby
PAA Teunissen, GJ Nijmeijer, RMGJ Queens, F Staals, RJ Van Wijk, ...
US Patent 6,987,555, 2006
362006
Level sensor, lithographic apparatus and device manufacturing method
AJA Bruinsma, F Staals, RJ Van Wijk, S Nihtianov
US Patent 7,148,494, 2006
162006
Towards Big Data Visualization for Monitoring and Diagnostics of High Volume Semiconductor Manufacturing
D Gkorou, A Ypma, G Tsirogiannis, M Giollo, D Sonntag, G Vinken, ...
Proceedings of the Computing Frontiers Conference, 338-342, 2017
122017
New recordable optical discs with metal thin film and organic film on polycarbonate
KS Min, YJ Huh, SH Kim, RJ van Wijk, G Dubbledam, N Maaskant
Japanese journal of applied physics 37 (4S), 2089, 1998
121998
Optimizing an apparatus for multi-stage processing of product units
N Jelle, A Ypma, D Gkorou, G Tsirogiannis, RJ Van Wijk, C Tzu-Chao, ...
US Patent 11,150,562, 2021
92021
Towards Interactive Feature Selection with Human-in-the-loop.
M Larranaga, D Gkorou, TS Guzella, A Ypma, F Hasibi, RJ van Wijk
IAL@ PKDD/ECML, 85-88, 2018
32018
Maintaining a set of process fingerprints
A Ypma, V Bastani, D Sonntag, N Jelle, HE Cekli, G Tsirogiannis, ...
US Patent 11,099,485, 2021
22021
Get a human-in-the-loop: Feature engineering via interactive visualizations
D Gkorou, M Larranaga, A Ypma, F Hasibi, RJ van Wijk
[Sl]:[Sn], 2020
22020
Optimizing an apparatus for multi-stage processing of product units
N Jelle, A Ypma, D Gkorou, G Tsirogiannis, RJ Van Wijk, C Tzu-Chao, ...
US Patent 11,520,238, 2022
2022
Assisted Diagnostics Methodology for Complex High-Tech Applications
M Velikova, C Bratosin, A Ypma, V Lemmen, RJ van Wijk
2019 4th International Conference on System Reliability and Safety (ICSRS …, 2019
2019
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