Lithographic apparatus, device manufacturing method, and device manufactured thereby PAA Teunissen, GJ Nijmeijer, RMGJ Queens, F Staals, RJ Van Wijk, ... US Patent 6,987,555, 2006 | 36 | 2006 |
Level sensor, lithographic apparatus and device manufacturing method AJA Bruinsma, F Staals, RJ Van Wijk, S Nihtianov US Patent 7,148,494, 2006 | 16 | 2006 |
Towards Big Data Visualization for Monitoring and Diagnostics of High Volume Semiconductor Manufacturing D Gkorou, A Ypma, G Tsirogiannis, M Giollo, D Sonntag, G Vinken, ... Proceedings of the Computing Frontiers Conference, 338-342, 2017 | 12 | 2017 |
New recordable optical discs with metal thin film and organic film on polycarbonate KS Min, YJ Huh, SH Kim, RJ van Wijk, G Dubbledam, N Maaskant Japanese journal of applied physics 37 (4S), 2089, 1998 | 12 | 1998 |
Optimizing an apparatus for multi-stage processing of product units N Jelle, A Ypma, D Gkorou, G Tsirogiannis, RJ Van Wijk, C Tzu-Chao, ... US Patent 11,150,562, 2021 | 9 | 2021 |
Towards Interactive Feature Selection with Human-in-the-loop. M Larranaga, D Gkorou, TS Guzella, A Ypma, F Hasibi, RJ van Wijk IAL@ PKDD/ECML, 85-88, 2018 | 3 | 2018 |
Maintaining a set of process fingerprints A Ypma, V Bastani, D Sonntag, N Jelle, HE Cekli, G Tsirogiannis, ... US Patent 11,099,485, 2021 | 2 | 2021 |
Get a human-in-the-loop: Feature engineering via interactive visualizations D Gkorou, M Larranaga, A Ypma, F Hasibi, RJ van Wijk [Sl]:[Sn], 2020 | 2 | 2020 |
Optimizing an apparatus for multi-stage processing of product units N Jelle, A Ypma, D Gkorou, G Tsirogiannis, RJ Van Wijk, C Tzu-Chao, ... US Patent 11,520,238, 2022 | | 2022 |
Assisted Diagnostics Methodology for Complex High-Tech Applications M Velikova, C Bratosin, A Ypma, V Lemmen, RJ van Wijk 2019 4th International Conference on System Reliability and Safety (ICSRS …, 2019 | | 2019 |