Highly enhanced hard x-ray emission from oriented metal nanorod arrays excited by intense femtosecond laser pulses S Mondal, I Chakraborty, S Ahmad, D Carvalho, P Singh, AD Lad, ... Physical Review B 83 (3), 035408, 2011 | 99 | 2011 |
Novel hexagonal polytypes of silver: growth, characterization and first-principles calculations I Chakraborty, D Carvalho, SN Shirodkar, S Lahiri, S Bhattacharyya, ... Journal of Physics: Condensed Matter 23 (32), 325401, 2011 | 54 | 2011 |
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction D Carvalho, K Müller-Caspary, M Schowalter, T Grieb, T Mehrtens, ... Scientific Reports 6, 2016 | 30 | 2016 |
N-type conductivity and properties of carbon-doped InN (0001) films grown by molecular beam epitaxy M Himmerlich, A Knübel, R Aidam, L Kirste, A Eisenhardt, S Krischok, ... Journal of Applied Physics 113 (3), 033501, 2013 | 18 | 2013 |
Selective ion-induced intermixing and damage in low-dimensional GaN/AlN quantum structures A Redondo-Cubero, K Lorenz, E Wendler, D Carvalho, T Ben, ... Nanotechnology 24 (50), 505717, 2013 | 16 | 2013 |
Ultra-low breakdown voltage and origin of 1/f2 noise in metallic nanorod arrays D Carvalho, S Ghosh, R Banerjee, P Ayyub Nanotechnology 19 (44), 445713, 2008 | 16 | 2008 |
High-Resolution Electron Diffraction: Accounting for Radially and Angularly Invariant Distortions D Carvalho, FM Morales Microscopy and Microanalysis 18 (03), 638-644, 2012 | 9 | 2012 |
Cubic and hexagonal InGaAsN dilute arsenides by unintentional homogeneous incorporation of As into InGaN FM Morales, D Carvalho, T Ben, R García, SI Molina, A Martí, A Luque, ... Scripta Materialia 66 (6), 351-354, 2012 | 4 | 2012 |
Quantitative Chemical Mapping of InGaN Quantum Wells from Calibrated High-Angle Annular Dark Field Micrographs D Carvalho, FM Morales, T Ben, R García, A Redondo-Cubero, E Alves, ... Microscopy and microanalysis: the official journal of Microscopy Society of …, 2015 | 3 | 2015 |
UCAHRED: Software developed at the University of Cádiz to achieve High Resolution Electron Diffraction D Carvalho, FM Morales, T Ben, R García | | |