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Co-authors
- Yves WiauxProfessor, Heriot-Watt University EdinburghVerified email at hw.ac.uk
- Kenneth E. BarnerCharles B Evans Professor, Electrical and Computer Engineering, University of DelawareVerified email at udel.edu
- Jean-Philippe ThiranEcole Polytechnique Fédérale de Lausanne (EPFL)Verified email at epfl.ch
- Jason McEwenUniversity College LondonVerified email at ucl.ac.uk
- Luisa F. PolaníaTarget CorporationVerified email at target.com
- Pierre-Jean AletCSEMVerified email at csem.ch
- Manuel Blanco-VelascoUniversity of AlcaláVerified email at uah.es
- Gonzalo R. ArceCharles B. Evans Professor, JP Morgan-Chase Faculty Fellow, University of DelawareVerified email at udel.edu
- Claudio BrivioBattery Engineer - Centre Suisse d'Electronique et de Microtechnique | CSEM SAVerified email at csem.ch
- Brian M SadlerThe University of Texas at AustinVerified email at ieee.org
- Jean-Christophe PesquetDistinguished Professor at CentraleSupélec, Université Paris-SaclayVerified email at centralesupelec.fr
- Yin ZhouWaymoVerified email at udel.edu
- Pierre VandergheynstProfessor of Electrical Engineering, Ecole Polytechnique Fédérale de Lausanne (EPFL)Verified email at epfl.ch